The development of resistance measurement techniques is very important for characterization of future nanoelectronics. Pulsed IV measurement techniques are very useful for accurate resistance measurements on nanoscale samples because of the efficient removal of e.g. EMF errors. In the project we have designed a pulsed IV-setup based on a state-of-the art current source (6221) and nanovoltmeter (2182A) from Keithley, and used the setup for resistance measurements on ferromagnetic samples. Two different samples were investigated using the pulsed IV system – ferromagnetic wires with a central nanoconstriction and amorphous microwires. We have tested the pulse delta system with different pulse widths, duty cycles and voltage levels. The results show a successful integration of the setup. From the measurement results we confirm that the pulse delta system provides accurate measurements with a low noise of about 0.02Ω. The resistance of the samples increases approximately quadratically with bias which is interpreted as a heating effect due to the very high current density of about 107A∙cm-2.