Under certain loading conditions, surfaces topography coupled with materials degree of brittleness can significantly compromise the mechanical performance of structures. The foregoing remains valid even if roughness is intentionally introduced for engineering reasons. In either case, stress can concentrate. The case of the stress concentration in surfaces having randomly distributed pits is a problem that, although being very practical, yet it remains unsolved. The complexity of a random configuration renders difficult the problem of analytically finding relationships between surface parameters and markers indicative of mechanical failure. Another difficulty is the reproducibility of replicates of specimens possessing random rough surfaces, for destructive testing followed by statistical analysis. An experimental technique to produce highly controlled replicates of random rough surfaces (including modeling of degradation growth) was developed. This method was used to experimentally and statistically study the effects on fracture of early randomly degraded surfaces of poly methyl methacrylate (PMMA) versus topographical parameters. Growth of degradation was assumed to go from an engineering surface to one whose heights are normally distributed. (Early stage of degradation is meant to be that level of roughness which is in the neighborhood of the critical flaw size for a given material). Among other findings, it was found that neither stress nor strain alone can be used to predict fracture at this early stage of degradation. However, fracture location was found to be strongly correlated to the ratio of the root-mean square roughness (RMS) to auto correlation length (ACL), above some RMS threshold. This correlation decreases as the material becomes less brittle (i.e., decrease of Young’s modulus or increase of percent of elongation). Simultaneously, a boundary value problem involving traction-free random rough surfaces was solved using a perturbation method, assuming elastic and isotropic conditions. For small RMS/ACL ratio, the solution for the RMS stress concentration factor, kt was found to be: kt = 1 + 2*SQRT(2)*(RMS/ACL), which agrees very well with the experimental work. Finally, a generalization of stress concentration factor formulas for several geometrical configurations and loading conditions into the Modified Inglis Formula was proposed. Finite element analysis was carried out and comparison was made with both experimental and analytical results. Applications of these results are broad. In surface engineering, for example, our analytical solution can be coupled with Fick’s Law to find critical conditions under which a film could become unstable to random roughness. Additionally, in design and maintenance of surfaces in service, it can be used to preliminarily assess how stress concentrates in surfaces where well defined notches cannot be used as an approximation.

La diffusion électromagnétique par des surfaces rugueuses concerne un ensemble très vaste de problèmes actuels en optronique (maîtrise des signatures/cloaking, analyse des signatures laser et infrarouge, imagerie active, localisation de la lumière, imagerie optique haute résolution, modélisation des interactions lumière matière et des signatures optiques, applications photovoltaïques et détecteurs infrarouges, biotechnologie). Les travaux réalisés dans le cadre de la thèse "Contrôle de la lumière par des éléments de surface désordonnés'' consistent à réaliser expérimentalement des surfaces rugueuses dont les propriétés statistiques sont contrôlées. Pour cela, un banc expérimental de photofabrication a été développé, utilisant sles propriétés statistiques des figures de speckle issues d'un faisceau laser mis en forme spatialement.Les surfaces réalisées présentent ainsi des propriétés statistiques qui n'existent pas à l'état naturel (fonction d'autocorrélation non gaussienne). Au delà de ces surfaces photofabriquées, le travaux de cette thèse s'intéressent également aux propriétés de surfaces de silicium fortement rugueuses caractérisées de Black Silicon. / Scattering of electromagnetic waves from rough surfaces is involved in a wide area of research in optronics (cloaking, laser and infrared signature analysis, active imaging, light localisation, high resolution optical imaging, laser-matter interaction and optical signature modelling, photovoltaics, infrared sensors, biotechnologies). Studies performed during the thesis ``Ligth control by random surface elements'' consist in the experimental fabrication of rough surfaces which statistical properties are controled. An experimental setup has been implemented, using the properties of a spatially shaped laser speckle pattern. The photofabricated surfaces show statistical properties that do not exist in nature such as non Gaussian autocorrelation function. Beyond these photofabricated surfaces, we also studied very rough surfaces of semi-conductor known as Black Silicon.