No description available.

No description available.

Thesis (Ph. D.)--OGI School of Science and Engineering at OHSU, 2001.

Thesis (B.S.)--University of Missouri, School of Mines and Metallurgy, 1940. / The entire thesis text is included in file. Typescript. Illustrated by author. Title from title screen of thesis/dissertation PDF file (viewed February 22, 2010) Includes bibliographical references (p. 24) and index (p. 25).

No description available.

No description available.

Thesis (B.S.)--University of Missouri, School of Mines and Metallurgy, 1936. / The entire thesis text is included in file. Typescript. Title from title screen of thesis/dissertation PDF file (viewed June 9, 2010)

M.S.

M.S.

Refractometry is a means to measure the refractive indices of liquids, gases, and dielectric solids, either isotropic or anisotropic, by observation of light refraction or reflection with a microscope, refractometer or other more specialized equipment. For anisotropic solids, refractometry by total reflection (RTR) is by far the simplest, most rapid, and precise method to determine the refractive indices, provided a polished surface of sufficient size exists. Its precision exceeds that for routine oil immersion techniques but compares less favorably to that for minimum deviation methods. However, minimum deviation requires large crystals and, moreover, specifically oriented prisms, one for each principal refractive index to be measured and, for triclinic crystals, one for each wavelength of measurement. The phenomenon of polarized light reflection from randomly oriented anisotropic materials has been modeled because, only after a complete understanding of these phenomena could the R TR method be automated. The mathematics and physics required for this stem from theories and equations presented in the literature of ellipsometry, polarized light, and physical optics. These were then modified, rewritten, and unified to suit the requirements of R TR. RTR, first used by Wollaston ( l 802a, l 802b ), was later perfected for the measurement of the refractive indices and orientation of biaxial minerals in thin section (Viola l 899a, l 899b, 1902; Comu 1901, 1902). RTR with the Abbe-Pulfrich refractometer yielded refractive indices to a precision of ±0.0002, or better. Later, Smith (1905a, 1905b) introduced a simpler refractometer, now known as the jeweler's refractometer, which had a precision of ±0.001 to ±0.002. This refractometer is still in use by gemologists. During this century familiarity with the early work has declined; thus several recent papers display a lack of knowledge of aspects of R TR which were already documented in the early 1900s. A new automated refractometer, designed by Bloss, has precision of ±0.0002 and will be able to measure the refractive indices and orientation of a biaxial mineral in a petrographic thin section. Even for triclinic crystals, a single polished surface arbitrarily oriented will suffice for measurement of all three principal refractive indices, whatever the wavelength supplied. The design and testing of this refractometer has taken approximately three years. Two prototypes have been built and tested. Results from the second prototype are presented. / Ph. D.