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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
41

A procedure to characterize electron-beam resist using a scanning electron microscope and study of process optimization of an electron beam imaging system using experimental design methods /

Pyles, Randall C. January 1992 (has links)
Thesis (M.S.)--Rochester Institute of Technology, 1992. / Typescript. Includes bibliographical references (leaves 114-116).
42

Image-based output trajectory estimation in scanning tunneling microscopes /

Clayton, Garrett M. January 2008 (has links)
Thesis (Ph. D.)--University of Washington, 2008. / Vita. Includes bibliographical references (p. 79-85).
43

Image motion compensation for an electronic imaging system /

Cain, James H. January 1986 (has links)
Thesis (M.S.)--Rochester Institute of Technology, 1986. / Typescript. Includes bibliographical references (leaf 40).
44

An EBSD study on mapping of small orientation differences in lattice mismatched heterostructures /

Tao, Xiaodong, January 2003 (has links)
Thesis (Ph. D.)--Lehigh University, 2004. / Includes vita. Includes bibliographical references (leaves 184-195).
45

Optimization of etching parameters for STM tips and an STM study of SiC (0001) [square root]3 x [square root]3 reconstruction /

Ng, Yee-fai. January 1998 (has links)
Thesis (M. Phil.)--University of Hong Kong, 1999. / Includes bibliographical references (leaves 100-101).
46

Scanning probe microscopy studies of active enzymes at solid surfaces

Hurth, Cedric Michael, January 1900 (has links) (PDF)
Thesis (Ph. D.)--University of Texas at Austin, 2005. / Vita. Includes bibliographical references.
47

Scanning probe microscopy and oxidation of silicon at breakdown voltages

Gcwabaza, Thabo. January 2006 (has links)
Theses (M.S.)--Marshall University, 2006. / Title from document title page. Includes abstract. Document formatted into pages: contains v, 75 pages including illustrations. Bibliography: p. 72-75.
48

Study of magnetic and multiferroic oxides by scanning force microscope

Chuang, Tien-Ming, January 1900 (has links) (PDF)
Thesis (Ph. D.)--University of Texas at Austin, 2006. / Vita. Includes bibliographical references.
49

The development of a non-destructive inspection system using 50MHz ultrasound

Crocker, R. L. January 1986 (has links)
A non-destructive inspection system using 50MHz ultrasound has been developed. The system has been designed to provide magnified visual images of the interior of solid materials. An ultrasonic transducer is scanned across the specimen to produce these images and consequently the system has become known as the Scanning Acoustic Microscope (SAM). The principles of operation of the SAM have been described in terms of wave theory and the electronic and computer sub-systems of which it is comprised. Images are presented on a computer monitor in eight colours. The colour of each picture point, or pixel, is determined by the amplitude of a reflection from the specimen. As the transducer scans in a raster pattern over the specimen a video cursor scans over the video memory in the computer and each pixel is coloured in turn. Thus the image is built up in real time as the transducer is scanned. The maximum range of scan is 300 x 300iran in the horizontal plane and 200mm vertically. The spatial resolution in all three axes is 7.5 microns. Applications in several areas of engineering and one medical area have been developed. The underlying principles of each inspection situation are described and results reported. These areas include inspection and evaluation of various forms of bond, volumetric inspection, particularly of engineering ceramic materials and the skin, and a measurement problem in the gas turbine industry. All the work reported has been undertaken on behalf of customers of Fulmer Research Institute Limited and it therefore represents a series of practical problems and solutions across a wide spectrum of industry.
50

On the scanning of arrays using quantized phase shifters /

Cohen, Jay Howard January 1968 (has links)
No description available.

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