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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

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Showing 1 to 3 of 3 (0.235 seconds)

Spelling suggestions: "subject:"semiconductors acharacterization"" "subject:"semiconductors gcharacterization""

1

Characterization of semiconductor layered structures by spectroscopic ellipsometry. / CUHK electronic theses & dissertations collection

January 1997 (has links)
by Guo Wensheng. / Thesis (Ph.D.)--Chinese University of Hong Kong, 1997. / Includes bibliographical references (p. 176-186). / Electronic reproduction. Hong Kong : Chinese University of Hong Kong, [2012] System requirements: Adobe Acrobat Reader. Available via World Wide Web. / Mode of access: World Wide Web.
Semiconductors--Characterization
Ellipsometry
Spectrum analysis
2

Nanometer characterization of quantum compound semiconductor heterostructures grown by molecular beam epitaxy

Wang, Yongqian 05 1900 (has links)
No description available.
Heterostructures
Atomic structure
Semiconductors Characterization
3

Characterisation of Group III nitrides using hard X-ray synchrotron radiation

Mudie, Stephen January 2004 (has links)
Abstract not available
Nitrides
Semiconductors -- Characterization
Crystals -- Structure
Epitaxy
X-ray crystallography
Diffractive scattering
Synchrotron radiation

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