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Characterization of semiconductor layered structures by spectroscopic ellipsometry. / CUHK electronic theses & dissertations collectionJanuary 1997 (has links)
by Guo Wensheng. / Thesis (Ph.D.)--Chinese University of Hong Kong, 1997. / Includes bibliographical references (p. 176-186). / Electronic reproduction. Hong Kong : Chinese University of Hong Kong, [2012] System requirements: Adobe Acrobat Reader. Available via World Wide Web. / Mode of access: World Wide Web.
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Nanometer characterization of quantum compound semiconductor heterostructures grown by molecular beam epitaxyWang, Yongqian 05 1900 (has links)
No description available.
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Characterisation of Group III nitrides using hard X-ray synchrotron radiationMudie, Stephen January 2004 (has links)
Abstract not available
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