• Refine Query
  • Source
  • Publication year
  • to
  • Language
  • No language data
  • Tagged with
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
1

Semiconductor P-N Junction Space Charge Region Capacitance

Habib, Mohammad Humayun 04 December 1992 (has links)
The classical capacitance voltage characteristics based on the depletion approximation, is adequate at reverse bias, but introduces errors at high forward bias. Because of its inherent simplicity and compactness this classical depletion model is well studied and widely used in circuit simulators. In this work, a new model for the semiconductor space charge region (SCR) capacitance, based on physical justification, will be derived. This new model takes three input parameters, C0 , Vbi and m, thus eliminating the fitting parameter FC currently used in SPICE. This new model is applicable for any applied voltage and will be compared with the SCR capacitance extracted from the numerical device simulator PISCES, and with the SCR capacitance models proposed by Gummel and Poon and by DeGraaff and Klaassen.

Page generated in 0.1206 seconds