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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

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Spelling suggestions: "subject:"tk7855.141 343 no.17"" "subject:"tk7855.141 443 no.17""

1

An x-ray method for measuring the thickness of thin crystalline films

January 1946 (has links)
[by] A. Eisenstein. / "Reprinted from Journal of applied physics, vol. 17, No. 11, 874-878, November, 1946." / Includes bibliographical references.
TK7855.M41 R43 no.17
Thin films

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