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RAPIDLY ADAPTABLE INSTRUMENTATION TESTER (RAIT)Vargo, Timothy D. 10 1900 (has links)
International Telemetering Conference Proceedings / October 25-28, 1999 / Riviera Hotel and Convention Center, Las Vegas, Nevada / Emerging technologies in the field of "Test & Measurement" have recently enabled the development of the Rapidly Adaptable Instrumentation Tester (RAIT). Based on software developed with LabVIEW®, the RAIT design enables quick reconfiguration to test and calibrate a wide variety of telemetry systems. The consequences of inadequate testing could be devastating if a telemetry system were to fail during an expensive flight mission. Supporting both open-bench testing as well as automated test sequences, the RAIT has significantly lowered total time required to test and calibrate a system. This has resulted in an overall lower per unit testing cost than has been achievable in the past.
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