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IR optical properties in thin films of diamondPetersson, Anna January 2011 (has links)
In the past decades new interest in diamond and possible applications of diamond has emerged. In this master thesis, optical properties of thin films of diamond were investigated for the possible use as an Internal Reflection Element (IRE) in Attenuated Total Reflection Fourier Infra Red (ATR-FTIR) spectroscopy. First a theoretical study of optical properties was made using Fresnel’s equations. Secondly the ray-tracing software TracePro was tested as a possible tool for further investigations of optical properties in advanced geometries. Finally, experimental measurements were made to compare the simulated result with measured data. Results obtained with TracePro were consistent with the theoretically expected results as to dependence of layer thickness, polarization and wavelength, and TracePro was therefore a possible tool for the investigation of optical properties in thin films. Although no extra information was given from TracePro for this specific geometry, TracePro can be a valuable tool in the investigation of more advanced geometries. The experimental measurements showed the importance of a well-defined layer thickness and also showed a stronger dependence of the underlying coating materials than expected from simulations. Further investigations need to be made to fully understand the dependence of the underlying coating materials SiO2 and Si3N4, particularly regarding different polarization states.
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Adhesion of diamond-like carbon thin films on various substrates /Chen, Ming, January 2000 (has links)
Thesis (M. Phil.)--University of Hong Kong, 2001. / Includes bibliographical references.
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Fabrication of superconducting YBa2Cu3Oy thin film on YSZ substrates with or without a Eu2CuO4 buffer layerYau, Chi-yat, Ben. January 2000 (has links)
Thesis (M. Phil.)--University of Hong Kong, 2001. / Includes bibliographical references (leaves 71-79).
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Multi-scale simulations of thin-film metal epitaxial growth /Borovikov, Valery. January 2008 (has links)
Dissertation (Ph.D.)--University of Toledo, 2008. / Typescript. "Submitted as partial fulfillment of the requirements for the Doctor of Philosophy Degree in Physics." Bibliography: leaves 137-143.
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Experimental and phenomenological study of persistent photoconductivity in YBa₂Cu₃O₆ thin films /Bubb, Daniel-Dennis McAlevy, January 2000 (has links)
Thesis (Ph.D.)--New Jersey Institute of Technology and Rutgers, The State University Of New Jersey-Newark, Federated Physics Department, 2000. / JT20011108 MBT20100106 ANT20100113 Typescript. Includes bibliographical references (leaves 108-115). Also available via the World Wide Web.
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Nonometer scale electrical characterization of thin dielectric filmsLee, David T. January 2002 (has links)
Thesis (Ph. D.)--Ohio State University, 2002. / Title from first page of PDF file. Document formatted into pages; contains xix, 148 p.; also contains graphics (some col.). Includes abstract and vita. Advisor: Jonathan Pelz, Dept. of Physics. Includes bibliographical references (p. 144-148).
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Sample fabrication and experimental design for studying interfacial creep at thin film/silicon interfaces /Thornell, Mark E. January 2004 (has links) (PDF)
Thesis (M.S. in Mechanical Engineering)--Naval Postgraduate School, March 2004. / Thesis advisor(s): Indranath Dutta. Includes bibliographical references (p. 41-42). Also available online.
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Adhesion induced instability in thin elastic film /Ghatak, Animangsu, January 2003 (has links)
Thesis (Ph. D.)--Lehigh University, 2003. / Includes vita. Includes bibliographical references (leaves 156-166).
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Stress evolution during Volmer-Weber thin film growth : a multi-scale approach for modeling diffusion, cohesion and attachment.Tello, Juan S. January 2008 (has links)
Thesis (Ph.D.)--Brown University, 2008. / Vita. Advisor: Allan Bower. Includes bibliographical references (leaves 77-80).
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Ultrathin films of metallofullerenes : preparation, characterization and photoelectrochemical applications /Yang, Shangfeng. January 2003 (has links)
Thesis (Ph. D.)--Hong Kong University of Science and Technology, 2003. / Includes bibliographical references. Also available in electronic version. Access restricted to campus users.
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