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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
1

Investigation of strain and spacer effects on transport property of La0.67Sr0.33MnO3 films doped with Pr0.67Ca0.33MnO3 and their multilayers. / Investigation of strain and spacer effects on transport property of La0.67Sr0.33MnO3 films doped with Pr0.67Ca0.33MnO3 and their multilayers.

January 2007 (has links)
Cheung, Wing Kin = 應變及間隔效應對La0.67Sr0.33MnO3摻雜Pr0.67Ca0.33MnO3的傳導特性的影響之研究 / 張榮健. / On t.p. "0.67", "0.33" and "3" are subscripts. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2007. / Includes bibliographical references (leaves 89-93). / Text in English; abstracts in English and Chinese. / Cheung, Wing Kin = Ying bian ji jian ge xiao ying dui La0.67Sr0.33MnO3 shan za Pr0.67Ca0.33MnO3 de chuan dao te xing de ying xiang zhi yan jiu / Zhang Rongjian. / Chapter 1 --- Introduction --- p.1 / Chapter 1.1 --- Development of magnetoresistance materials --- p.1 / Chapter 1.2 --- What is magnetoresistance? --- p.1 / Chapter 1.2.1 --- Anisotropic magnetoresistance --- p.2 / Chapter 1.2.2 --- Giant magnetoresistance (GMR) --- p.3 / Chapter 1.2.3 --- Colossal magnetoresistance (CMR) --- p.4 / Chapter 1.3 --- Possible origins of CMR in manganites --- p.6 / Chapter 1.3.1 --- Tolerance factor --- p.6 / Chapter 1.3.2 --- Double exchange mechanism --- p.8 / Chapter 1.3.3 --- Jahn-Teller distortion --- p.11 / Chapter 1.3.4 --- Charge-ordering and phase separation --- p.13 / Chapter 1.4 --- Movtiation --- p.17 / Chapter 1.5 --- Literature review --- p.18 / Chapter 1.5.1 --- Single-layer manganite thin films --- p.18 / Chapter 1.5.2 --- Multilayer system - manganites with insulating spacers --- p.19 / Chapter 1.6 --- Scope of thesis --- p.20 / Chapter 2 --- Instrumentation --- p.21 / Chapter 2.1 --- Sample preparation --- p.21 / Chapter 2.1.1 --- Facing-target sputtering technique (FTS) --- p.21 / Chapter 2.1.2 --- Deposition system --- p.24 / Chapter 2.2 --- Annealing system --- p.26 / Chapter 2.2.1 --- Oxygen annealing --- p.26 / Chapter 2.3 --- Sample characterization --- p.28 / Chapter 2.3.1 --- X-ray diffraction (XRD) --- p.28 / Chapter 2.3.2 --- Alpha - step profiler --- p.30 / Chapter 2.3.3 --- Transport property measurement --- p.30 / Chapter 3 --- Preparation and characterization of single-layer thin films --- p.32 / Chapter 3.1 --- Introduction --- p.32 / Chapter 3.2 --- Fabrication and characteristization of the sputtering targets --- p.32 / Chapter 3.3 --- Deposition procedure --- p.36 / Chapter 3.3.1 --- Preparation of substrate --- p.36 / Chapter 3.3.2 --- Deposition process --- p.36 / Chapter 3.4 --- Parameters related to epitaxial growth of LPSCMO thin films --- p.37 / Chapter 3.4.1 --- Substrate materials --- p.37 / Chapter 3.4.2 --- Substrate temperature --- p.38 / Chapter 3.4.3 --- Oxygen partial pressure --- p.38 / Chapter 4 --- Thickness and strain effects in epitaxial LPSCMO thin films --- p.43 / Chapter 4.1 --- Introduction --- p.43 / Chapter 4.2 --- Structural characterization of LPSCMO thin films --- p.45 / Chapter 4.2.1 --- Thickness effect --- p.45 / Chapter 4.2.2 --- Strain effect --- p.49 / Chapter 4.3 --- Transport properties and magnetoresistance measurement --- p.51 / Chapter 4.3.1 --- Thickness effect --- p.51 / Chapter 4.3.2 --- Strain effect --- p.60 / Chapter 4.4 --- Discussion --- p.63 / Chapter 5 --- Effect of spacer in [LPSCMO/SCuO] multilayer --- p.65 / Chapter 5.1 --- Sample preparation --- p.65 / Chapter 5.2 --- Characterization of as-deposited multilayer samples --- p.67 / Chapter 5.2.1 --- Structural anaylsis --- p.67 / Chapter 5.2.2 --- Resistance measurement --- p.72 / Chapter 5.3 --- Oxygen-annealing treatment --- p.76 / Chapter 5.3.1 --- Introduction --- p.76 / Chapter 5.3.2 --- Structural anaylsis --- p.77 / Chapter 5.3.3 --- Resistance measurement --- p.78 / Chapter 5.4 --- Discussion --- p.85 / Chapter 6 --- Conclusion --- p.87 / Chapter 6.1 --- Summary --- p.87 / Chapter 6.2 --- Future outlook --- p.88 / Bibliography --- p.89
2

Metal-insulator transition in perovskite manganite: multilayers and junction. / 錳氧化物的金屬-絶緣體轉變: 多層薄膜及異構結 / Metal-insulator transition in perovskite manganite: multilayers and junction. / Meng yang hua wu de jin shu-jue yuan ti zhuan bian: duo ceng bo mo ji yi gou jie

January 2006 (has links)
by Tsai Yau Moon = 錳氧化物的金屬-絶緣體轉變 : 多層薄膜及異構結 / 蔡友滿. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2006. / Includes bibliographical references. / Text in English; abstracts in English and Chinese. / by Tsai Yau Moon = Meng yang hua wu de jin shu-jue yuan ti zhuan bian : duo ceng bo mo ji yi gou jie / Cai Youman. / Abstract / 論文摘要 / Acknowledgements / Table of Contents / List of Figures / List of Tables / Chapter Chapter 1 --- Introduction / Chapter 1.1 --- Perovskite-type structure / Chapter 1.2 --- Metal-insulator transition / Chapter 1.3 --- Magnetoresistance / Chapter 1.3.1 --- Giant magnetoresistance (GMR) / Chapter 1.3.2.1 --- Colossal magnetoresistance (CMR) in perovskite manganites / Chapter 1.3.2.2 --- Possible origin of CMR / Chapter 1.4 --- Brief review of p-n junction between perovskite manganites and STON (001) / Chapter 1.5 --- Our project / Chapter 1.6 --- Scope of this thesis work / References / Chapter Chapter 2 --- Preparation and characterization of manganite thin films / Chapter 2.1 --- Thin film deposition / Chapter 2.1.1 --- Facing-target sputtering (FTS) / Chapter 2.1.2 --- Vacuum system / Chapter 2.1.3 --- Deposition procedure / Chapter 2.1.4 --- Deposition conditions / Chapter 2.1.5 --- Oxygen annealing system / Chapter 2.1.6 --- Silver electrode coating system / Chapter 2.2 --- Characterization / Chapter 2.2.1 --- Alpha step profilometer / Chapter 2.2.2 --- X-ray diffraction (XRD) / Chapter 2.2.3 --- Transport property measurement / References / Chapter Chapter 3 --- [LCSMO/PCMO] multilayers / Chapter 3.1 --- [LCSMO (100 A)/PCMO (X A)] multilayers / Chapter 3.1.1 --- Sample preparation / Chapter 3.1.2 --- Results and discussion / Chapter 3.1.2.1 --- Structural analysis / Chapter 3.1.2.2 --- Transport properties / Chapter 3.2 --- [LCSMO (50 A)/PCMO (X A)] multilayers / Chapter 3.2.1 --- Sample preparation / Chapter 3.2.2 --- Results and discussion / Chapter 3.2.2.1 --- Structural analysis / Chapter 3.2.2.2 --- Transport properties / References / Chapter Chapter 4 --- [LSMO/PCMO] multilayers and LSMO/STON p-n junction / Chapter 4.1 --- [LSMO/PCMO] multilayers / Chapter 4.1.1 --- Sample preparation / Chapter 4.1.2 --- Results and discussion / Chapter 4.1.2.1 --- Structural analysis / Chapter 4.1.2.2 --- Magnetization / Chapter 4.2 --- LSMO/STON heterojunction / Chapter 4.2.1 --- Sample preparation / Chapter 4.2.2 --- Results and discussion / Chapter 4.2.2.1 --- Structural analysis / Chapter 4.2.2.2 --- Metal insulator transition of LSMO revealed by four point I-V measurement / Chapter 4.3 --- Conclusion / References / Chapter 5 Conclusion / Chapter 5.1 --- Conclusion / Chapter 5.2 --- Future outlook

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