Cheung, Wing Kin = 應變及間隔效應對La0.67Sr0.33MnO3摻雜Pr0.67Ca0.33MnO3的傳導特性的影響之研究 / 張榮健. / On t.p. "0.67", "0.33" and "3" are subscripts. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2007. / Includes bibliographical references (leaves 89-93). / Text in English; abstracts in English and Chinese. / Cheung, Wing Kin = Ying bian ji jian ge xiao ying dui La0.67Sr0.33MnO3 shan za Pr0.67Ca0.33MnO3 de chuan dao te xing de ying xiang zhi yan jiu / Zhang Rongjian. / Chapter 1 --- Introduction --- p.1 / Chapter 1.1 --- Development of magnetoresistance materials --- p.1 / Chapter 1.2 --- What is magnetoresistance? --- p.1 / Chapter 1.2.1 --- Anisotropic magnetoresistance --- p.2 / Chapter 1.2.2 --- Giant magnetoresistance (GMR) --- p.3 / Chapter 1.2.3 --- Colossal magnetoresistance (CMR) --- p.4 / Chapter 1.3 --- Possible origins of CMR in manganites --- p.6 / Chapter 1.3.1 --- Tolerance factor --- p.6 / Chapter 1.3.2 --- Double exchange mechanism --- p.8 / Chapter 1.3.3 --- Jahn-Teller distortion --- p.11 / Chapter 1.3.4 --- Charge-ordering and phase separation --- p.13 / Chapter 1.4 --- Movtiation --- p.17 / Chapter 1.5 --- Literature review --- p.18 / Chapter 1.5.1 --- Single-layer manganite thin films --- p.18 / Chapter 1.5.2 --- Multilayer system - manganites with insulating spacers --- p.19 / Chapter 1.6 --- Scope of thesis --- p.20 / Chapter 2 --- Instrumentation --- p.21 / Chapter 2.1 --- Sample preparation --- p.21 / Chapter 2.1.1 --- Facing-target sputtering technique (FTS) --- p.21 / Chapter 2.1.2 --- Deposition system --- p.24 / Chapter 2.2 --- Annealing system --- p.26 / Chapter 2.2.1 --- Oxygen annealing --- p.26 / Chapter 2.3 --- Sample characterization --- p.28 / Chapter 2.3.1 --- X-ray diffraction (XRD) --- p.28 / Chapter 2.3.2 --- Alpha - step profiler --- p.30 / Chapter 2.3.3 --- Transport property measurement --- p.30 / Chapter 3 --- Preparation and characterization of single-layer thin films --- p.32 / Chapter 3.1 --- Introduction --- p.32 / Chapter 3.2 --- Fabrication and characteristization of the sputtering targets --- p.32 / Chapter 3.3 --- Deposition procedure --- p.36 / Chapter 3.3.1 --- Preparation of substrate --- p.36 / Chapter 3.3.2 --- Deposition process --- p.36 / Chapter 3.4 --- Parameters related to epitaxial growth of LPSCMO thin films --- p.37 / Chapter 3.4.1 --- Substrate materials --- p.37 / Chapter 3.4.2 --- Substrate temperature --- p.38 / Chapter 3.4.3 --- Oxygen partial pressure --- p.38 / Chapter 4 --- Thickness and strain effects in epitaxial LPSCMO thin films --- p.43 / Chapter 4.1 --- Introduction --- p.43 / Chapter 4.2 --- Structural characterization of LPSCMO thin films --- p.45 / Chapter 4.2.1 --- Thickness effect --- p.45 / Chapter 4.2.2 --- Strain effect --- p.49 / Chapter 4.3 --- Transport properties and magnetoresistance measurement --- p.51 / Chapter 4.3.1 --- Thickness effect --- p.51 / Chapter 4.3.2 --- Strain effect --- p.60 / Chapter 4.4 --- Discussion --- p.63 / Chapter 5 --- Effect of spacer in [LPSCMO/SCuO] multilayer --- p.65 / Chapter 5.1 --- Sample preparation --- p.65 / Chapter 5.2 --- Characterization of as-deposited multilayer samples --- p.67 / Chapter 5.2.1 --- Structural anaylsis --- p.67 / Chapter 5.2.2 --- Resistance measurement --- p.72 / Chapter 5.3 --- Oxygen-annealing treatment --- p.76 / Chapter 5.3.1 --- Introduction --- p.76 / Chapter 5.3.2 --- Structural anaylsis --- p.77 / Chapter 5.3.3 --- Resistance measurement --- p.78 / Chapter 5.4 --- Discussion --- p.85 / Chapter 6 --- Conclusion --- p.87 / Chapter 6.1 --- Summary --- p.87 / Chapter 6.2 --- Future outlook --- p.88 / Bibliography --- p.89

by Tsai Yau Moon = 錳氧化物的金屬-絶緣體轉變 : 多層薄膜及異構結 / 蔡友滿. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2006. / Includes bibliographical references. / Text in English; abstracts in English and Chinese. / by Tsai Yau Moon = Meng yang hua wu de jin shu-jue yuan ti zhuan bian : duo ceng bo mo ji yi gou jie / Cai Youman. / Abstract / 論文摘要 / Acknowledgements / Table of Contents / List of Figures / List of Tables / Chapter Chapter 1 --- Introduction / Chapter 1.1 --- Perovskite-type structure / Chapter 1.2 --- Metal-insulator transition / Chapter 1.3 --- Magnetoresistance / Chapter 1.3.1 --- Giant magnetoresistance (GMR) / Chapter 1.3.2.1 --- Colossal magnetoresistance (CMR) in perovskite manganites / Chapter 1.3.2.2 --- Possible origin of CMR / Chapter 1.4 --- Brief review of p-n junction between perovskite manganites and STON (001) / Chapter 1.5 --- Our project / Chapter 1.6 --- Scope of this thesis work / References / Chapter Chapter 2 --- Preparation and characterization of manganite thin films / Chapter 2.1 --- Thin film deposition / Chapter 2.1.1 --- Facing-target sputtering (FTS) / Chapter 2.1.2 --- Vacuum system / Chapter 2.1.3 --- Deposition procedure / Chapter 2.1.4 --- Deposition conditions / Chapter 2.1.5 --- Oxygen annealing system / Chapter 2.1.6 --- Silver electrode coating system / Chapter 2.2 --- Characterization / Chapter 2.2.1 --- Alpha step profilometer / Chapter 2.2.2 --- X-ray diffraction (XRD) / Chapter 2.2.3 --- Transport property measurement / References / Chapter Chapter 3 --- [LCSMO/PCMO] multilayers / Chapter 3.1 --- [LCSMO (100 A)/PCMO (X A)] multilayers / Chapter 3.1.1 --- Sample preparation / Chapter 3.1.2 --- Results and discussion / Chapter 3.1.2.1 --- Structural analysis / Chapter 3.1.2.2 --- Transport properties / Chapter 3.2 --- [LCSMO (50 A)/PCMO (X A)] multilayers / Chapter 3.2.1 --- Sample preparation / Chapter 3.2.2 --- Results and discussion / Chapter 3.2.2.1 --- Structural analysis / Chapter 3.2.2.2 --- Transport properties / References / Chapter Chapter 4 --- [LSMO/PCMO] multilayers and LSMO/STON p-n junction / Chapter 4.1 --- [LSMO/PCMO] multilayers / Chapter 4.1.1 --- Sample preparation / Chapter 4.1.2 --- Results and discussion / Chapter 4.1.2.1 --- Structural analysis / Chapter 4.1.2.2 --- Magnetization / Chapter 4.2 --- LSMO/STON heterojunction / Chapter 4.2.1 --- Sample preparation / Chapter 4.2.2 --- Results and discussion / Chapter 4.2.2.1 --- Structural analysis / Chapter 4.2.2.2 --- Metal insulator transition of LSMO revealed by four point I-V measurement / Chapter 4.3 --- Conclusion / References / Chapter 5 Conclusion / Chapter 5.1 --- Conclusion / Chapter 5.2 --- Future outlook