With the emergence of the deep submicron era, process variations have gained importance in issues related to chip design. The impact of process variations is measured using manufacturing/parametric yield. In order to get an accurate estimate of yield, the parameters considered need to be monitored at a large number of locations. Nowadays, intra-die variations are an integral part of the overall process uctuations. This leads to the difficult case where yield prediction has to be done while considering independent and partially correlated variations. The presence of partial correlations adds to the existing trouble caused by the volume of variables. This thesis proposes two techniques for reducing the number of variables and hence the complexity of the yield computation problem namely - Principal Component Analysis (PCA) and Hierarchical Adaptive Quadrisection (HAQ). Systematic process variations are also included in our yield model. The biggest plus in these two methods is reducing the size of the yield prediction problem (thus making it less time complex) without affecting the accuracy in yield. The efficiency of these two approaches is measured by comparing with the results obtained from Monte Carlo simulations. Compared to previous work, the PCA based method can reduce the error in yield estimation from 17.1% - 21.1% to 1.3% - 2.8% with 4.6x speedup. The HAQ technique can reduce the error to 4.1% - 5.6% with 6x - 9.4x speedup.

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Thesis (Ph. D.)--Cornell University, June 1902. / Bibliography: p. [90]-97.

Thesis (Ph. D.)--Cornell University, June 1902. / Bibliography: p. [90]-97.

Thesis (M.S.)--University of Wisconsin--Madison, 1984. / Typescript. eContent provider-neutral record in process. Description based on print version record. Includes bibliographical references (leaves 54-56).

Thesis (Ph. D.)--University of Wisconsin--Madison, 1981. / Typescript. Vita. eContent provider-neutral record in process. Description based on print version record. Includes bibliographical references (leaves 162-167).

2 p. / Grain yield, test weight, and other characteristics of barley, durum, and wheat varieties are provided in this publication. Revised 2017, Previous version10/2016. Previous version 10/2015.

2 pp. / Grain yield, test weight, and other characteristics of barley, durum, and wheat varieties are provided in this publication.Revised 10/2016. Previous version 10/2015.

3 pp. / Lodging has historically been a problem in small grain production. Palisade is a relatively new plant growth regulator that has shown some promise in reducing lodging. The effect of Palisade on height and lodging of durum, and subsequent yield was tested in a study at the Maricopa Ag Center. Plant height was not affected by Palisade since the chemical was applied at boot, one stage past the recommended window where the plant was near maximum height. Lodging was reduced from 83 to 61% and 28 to 8% under the high and medium input growing conditions, respectively. Grain yield was increased from 4481 to 6152 lb/acre and 5600 to 7330 lb/acre under high and medium input growing conditions, respectively. Palisade is effective in reducing but not eliminating lodging, and can have a large impact on yield as in this study.