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The effect of light-emitting diode light on the growth, egg production, egg quality, hormone concentration and health of Hy-Line® W-36 laying hensPoudel, Ishab 25 November 2020 (has links)
Light-emitting diode (LED) is an improved light delivery technology that provides better energy efficiency, longer lifespan, and the ability to select a specific wavelength of light. We evaluated the effect of blue and red-LED on performance, behavior, egg quality, hormonal concentration, and prevalence of Avian pathogenic E. coli (APEC) like E. coli in pullets and laying hens raised in cageree housing system. Results showed that birds raised in blue-LED during the pullet phase had higher body weight and earlier onset of early lay. Red-LED increased the yolk percentage, illustrating that red-LED can stimulate reproduction. Red-LED also decreased the relative spleen percentage, which is an indication of decreased immunity. Overall egg production was not affected by the light treatment. Irrespective of the light treatment, a higher prevalence of APEC like E. coli was found in colonies isolated from the trachea suggesting a possible route of transmission in cageree housing system.
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Methods for 3D Structured Light Sensor Calibration and GPU Accelerated ColormapKurella, Venu January 2018 (has links)
In manufacturing, metrological inspection is a time-consuming process.
The higher the required precision in inspection, the longer the
inspection time. This is due to both slow devices that collect
measurement data and slow computational methods that process the data.
The goal of this work is to propose methods to speed up some of these
processes. Conventional measurement devices like Coordinate Measuring
Machines (CMMs) have high precision but low measurement speed while
new digitizer technologies have high speed but low precision. Using
these devices in synergy gives a significant improvement in the
measurement speed without loss of precision. The method of synergistic
integration of an advanced digitizer with a CMM is discussed.
Computational aspects of the inspection process are addressed next. Once
a part is measured, measurement data is compared against its
model to check for tolerances. This comparison is a time-consuming
process on conventional CPUs. We developed and benchmarked some GPU accelerations. Finally, naive data fitting methods can produce misleading results in cases with non-uniform data. Weighted total least-squares methods can compensate for non-uniformity. We show how they can be accelerated with GPUs, using plane fitting as an example. / Thesis / Doctor of Philosophy (PhD)
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