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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

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Testování spojů a externích paměťových komponent v FPGA / Testing of Wires and External Memory Components in FPGA

Louda, Martin January 2008 (has links)
This work deals with COMBO2 card interconnect and memory devices testing. In the beginning of the paper, some existing testing algorithms for interconnect and RAM memories testing are introduced. This work is devoted to proposal of generic architecture for interconnect and memory devices testing. The proposed architecture is optimized for FPGA implementation.

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