<p>Modern semiconductor design methods makes it possible to design increasingly complex system-on-a-chips (SOCs). Testing such SOCs becomes highly expensive due to the rapidly increasing test data volumes with longer test times as a result. Several approaches exist to compress the test stimuli and where hardware is added for decompression. This master’s thesis presents a test data compression method based on a modified facsimile code. An embedded processor on the SOC is used to decompress and apply the data to the cores of the SOC. The use of already existing hardware reduces the need of additional hardware. </p><p>Test data may be rearranged in some manners which will affect the compression ratio. Several modifications are discussed and tested. To be realistic a decompressing algorithm has to be able to run on a system with limited resources. With an assembler implementation it is shown that the proposed method can be effectively realized in such environments. Experimental results where the proposed method is applied to benchmark circuits show that the method compares well with similar methods. </p><p>A method of including the response vector is also presented. This approach makes it possible to abort a test as soon as an error is discovered, still compressing the data used. To correctly compare the test response with the expected one the data needs to include don’t care bits. The technique uses a mask vector to mark the don’t care bits. The test vector, response vector and mask vector is merged in four different ways to find the most optimal way.</p>

Modern semiconductor design methods makes it possible to design increasingly complex system-on-a-chips (SOCs). Testing such SOCs becomes highly expensive due to the rapidly increasing test data volumes with longer test times as a result. Several approaches exist to compress the test stimuli and where hardware is added for decompression. This master’s thesis presents a test data compression method based on a modified facsimile code. An embedded processor on the SOC is used to decompress and apply the data to the cores of the SOC. The use of already existing hardware reduces the need of additional hardware. Test data may be rearranged in some manners which will affect the compression ratio. Several modifications are discussed and tested. To be realistic a decompressing algorithm has to be able to run on a system with limited resources. With an assembler implementation it is shown that the proposed method can be effectively realized in such environments. Experimental results where the proposed method is applied to benchmark circuits show that the method compares well with similar methods. A method of including the response vector is also presented. This approach makes it possible to abort a test as soon as an error is discovered, still compressing the data used. To correctly compare the test response with the expected one the data needs to include don’t care bits. The technique uses a mask vector to mark the don’t care bits. The test vector, response vector and mask vector is merged in four different ways to find the most optimal way.

This study explores the possibilities for reducing the number of pins needed for scan mode interface. In the first part of this paper the existing solutions and methods that are usable for this purpose are described. Specific four pin, three pin, two pin, one pin and zero pin interfaces are designed in second part. Advantages and disadvantages of existing solutions and methods as well as designed and proposed interface are summarized in the conclusion.