Mid-infrared lasers in the 3-5 µm range are important for wide variety of applications including trace gas sensing, infrared counter measures, free space optical communications, etc. GaSb-based type-I quantum well (QW) diode lasers are an attractive choice due to their relatively simple design and growth tolerances, as compared with quantum cascade lasers and interband cascade lasers. Excellent diode lasers have been demonstrated for wavelengths up to ~3.0 µm, employing GaInAsSb/AlGaAsSb QW active regions. But, device performance tends to degrade at longer wavelengths, due to Auger recombination and decreasing QW valence band offsets. In this work we look into the feasibility of using highly strained GaInAsSb/GaSb QWs as active regions for diode lasers operating at wavelengths beyond 3.0 µm. Heavy strain in the QW can improve valence band offset and also increase the splitting between the heavy and light hole bands which can help minimize Auger recombination. Through optimized molecular beam epitaxy (MBE) growth conditions we were able to incorporate up to 2.45 % compressive strain in these QWs enabling laser operation up to 3.4 µm at room temperature. An alternate path to extend the emission wavelength is to incorporate dilute quantities of nitrogen into the QW. Incorporating dilute quantities of substitutional nitrogen into traditional III-V’s strongly reduces the bandgap of the alloy. The advantage for the case of GaSb based dilute-nitrides is that the bandgap reduction is almost exclusively due to the lowering of the conduction band leaving the valence band offsets unaffected; thus providing a path to mitigating hole leakage while extending the emission wavelength. Although GaSb-based dilute-nitrides are a potentially elegant solution for extending the operating wavelength of GaSb-based type-I QW diode lasers, the luminescence efficiency of this material system has been relatively poor. This is most likely due to the presence of a high concentration of point defects, like nitrogen substitutional clusters. Through careful optimization of MBE growth conditions and post growth annealing, we demonstrate improved luminescence efficiency. With further optimization this material system can potentially extend the emission wavelength of GaSb-based type-I QW diode lasers even further into the mid-infrared spectrum. / text

Multi-junction photovoltaic devices based on III-V semiconductors have applications in space power systems and terrestrial concentrating photovoltaics, as well as in power-over-fibre and optical power conversion systems. These devices have between two and twenty junctions arranged in tandem, connected in series with optically transparent tunnel diodes. In some cases, they may include as many as eight different materials, including ternary and quaternary alloys, and >100 epitaxial layers in total. A general method for simulating performance of these devices using drift-diffusion based device simulation tools is reviewed. This includes discussion of the geometry, discretization, and physical equations to be solved. A set of material parameters for some important materials is listed, and solutions are shown for an example of a lattice-matched four-junction GaInP / (In)AlGaAs / InGaAsN(Sb) / Ge solar cell including a dilute nitride based p-i-n junction with ∼ 0.9 eV band gap. A sample of this dilute nitride junction with a 650 nm absorber layer was grown by molecular beam epitaxy and was shown to have short-circuit current density of 15.1 mA/cm2, sufficient for use in the 4-junction structure, while transmitting sufficient light through to the bottom (germanium) junction. Open-circuit voltage was up to 0.186 V at 1-sun, increasing to 0.436 V under 1500 suns concentration. The device simulation methodology was extended to include effects of luminescent coupling and photon recycling. These effects are included by adding a term to the electron and hole continuity equations, and the resulting coupled system of equations is solved. No external iterative loop is required, as has been the case in other efforts to model these effects. A five-junction photonic power converter (PPC) is simulated and it is shown that the quantum efficiency of the device is significantly broadened through luminescent coupling. There is a 350 mV reduction in simulated open-circuit voltage (70 mV per junction) if luminescent coupling is neglected. This work was later extended to a 12-junction PPC device, where the simulation predicts a wavelength sensitivity of -1.1%/nm in the absence of luminescent coupling; this is reduced to -0.4%/nm when luminescent coupling is included in the calculation. The latter result, and the overall shape of the simulated quantum efficiency curve agree closely with experimental measurements. Finally, two specific applications of PPCs are demonstrated. The first is in a step-up DC-to-DC converter, where a linear regulator combined with a laser/PPC pair can convert a 3.3 V input (commonly available from a single lithium polymer battery cell) into 12 V. Unlike conventional switching boost converters, this ‘photonic boost converter’ is not a source of ripple. In testing, a >80 dB reduction in ripple was measured compared with an equivalent switching boost converter, limited only by input noise of the instrument.The second application is in a 60 kW, 650 V switching circuit such as might be found in a hybrid or electric vehicle drivetrain. These circuits need several isolated power supplies to power gate drivers for the IGBT or SiC MOSFET switching components. This isolation is commonly provided by a small transformer, which inherently has a parasitic capacitance between primary and secondary windings and creates a path for EMI currents to flow from the high-power components to the power supply and control circuitry. By using a laser/PPC pair to provide the needed isolation, this parasitic capacitance can be largely eliminated; a 20 dB reduction in EMI current reaching the control FPGA is demonstrated.

abstract: Silicon photovoltaics is the dominant contribution to the global solar energy production. As increasing conversion efficiency has become one of the most important factors to lower the cost of photovoltaic systems, the idea of making a multijunction solar cell based on a silicon bottom cell has attracted broad interest. Here the potential of using dilute nitride GaNPAs alloys for a lattice-matched 3-terminal 2-junction Si-based tandem solar cell through multiscale modeling is investigated. To calculate the electronic band structure of dilute nitride alloys with relatively low computational cost, the sp^3 d^5 s^* s_N tight-binding model is chosen, as it has been demonstrated to obtain quantitatively correct trends for the lowest conduction band near Γ, L, and X for dilute-N GaNAs. A genetic algorithm is used to optimize the sp^3 d^5 s^* tight-binding model for pure GaP and GaAs for their optical properties. Then the optimized sp^3 d^5 s^* s_N parametrizations are obtained for GaNP and GaNAs by fitting to experimental bandgap values. After that, a virtual crystal approach gives the Hamiltonian for GaNPAs alloys. From their tight-binding Hamiltonian, the first-order optical response functions of dilute nitride GaNAs, GaNP, and GaNPAs are calculated. As the N mole fraction varies, the calculated critical optical features vary with the correct trends, and agree well with experiment. The calculated optical properties are then used as input for the solar device simulations based on Silvaco ATLAS. For device simulation, a bottom cell model is first constructed to generate performance results that agree well with a demonstrated high-efficiency Si heterojunction interdigitated back contact (IBC) solar cell reported by Kaneka. The front a-Si/c-Si interface is then replaced by a GaP/Si interface for the investigation of the sensitivity of the GaP/Si interface to interface defects in terms of degradation of the IBC cell performance, where we find that an electric field that induces strong band bending can significantly mitigate the impact of the interfacial traps. Finally, a lattice-matched 3-terminal 2-junction tandem model is built for performance simulation by stacking a dilute nitride GaNP(As) cell on the Si IBC cell connected through a GaP/Si interface. The two subcells operate quasi-independently. In this 3-terminal tandem model, traps at the GaP/Si interface still significantly impact the performance of the Si subcell, but their effects on the GaNP subcell are relatively small. Assuming the interfacial traps are well passivated, the tandem efficiency surpasses that of a single-junction Si cell, with values close to 33% based on realistic parameters. / Dissertation/Thesis / Doctoral Dissertation Electrical Engineering 2019

In this thesis, we investigate optical and electrical properties of dilute nitride semiconductors GaAsN in pulsed magnetic fields up to 62 T. For the most part, the experiments are performed at the Dresden High Magnetic Field Laboratory (HLD). In the first part of this thesis, the electron effective mass of GaAsN is determined with a direct method for the first time. Cyclotron resonance (CR) absorption spectroscopy is performed in Si-doped GaAsN epilayers with a nitrogen content up to 0.2%. For the CR absorption study, we use the combination of the free-electron laser FELBE and pulsed magnetic fields at the HLD, both located at the Helmholtz-Zentrum Dresden-Rossendorf. A slight increase of the CR electron effective mass with N content is obtained. This result is in excellent agreement with calculations based on the band anticrossing model and the empirical tight-binding method. We also find an increase of the band nonparabolicity with increasing N concentration in agreement with our calculations of the energy dependent momentum effective mass. In the second part of this thesis, the photoluminescence (PL) characteristics of intrinsic GaAsN and n-doped GaAsN:Si is studied. The PL of intrinsic and very dilute GaAsN is characterized by both GaAs-related transitions and N-induced features. These distinct peaks merge into a broad spectral band of localized excitons (LEs) when the N content is increased. This so-called LE-band exhibits a partially delocalized character because of overlapping exciton wave functions and an efficient interexcitonic population transfer. Merged spectra dominate the PL of all Si-doped GaAsN samples. They have contributions of free and localized excitons and are consequently blue-shifted with respect to LE-bands of intrinsic GaAsN. The highly merged PL profiles of GaAsN:Si are studied systematically for the first time with temperature-dependent time-resolved PL. The PL decay is predominantly monoexponential and has a strong energy dispersion. In comparison to formerly reported values of intrinsic GaAsN epilayers, the determined decay times of GaAsN:Si are reduced by a factor of 10 because of enhanced Shockley-Read-Hall and possibly Auger recombinations. In the third part of this thesis, intrinsic and Si-doped GaAsN are investigated with magneto-PL in fields up to 62 T. A magneto-PL setup for pulsed magnetic fields of the HLD was built for this purpose. The blue-shift of LE-bands is studied in high magnetic fields in order to investigate its delocalized character. The blue-shift is diminished in intrinsic GaAsN at higher temperatures, which indicates that the interexcitonic population transfer is only active below a critical temperature 20 K < T < 50 K. A similar increase of the temperature has no significant impact on the partially delocalized character of the merged spectral band of GaAsN:Si. We conclude that the interexcitonic transfer of Si-doped GaAsN is more complex than in undoped GaAsN. In order to determine reduced masses of undoped GaAsN and GaAs:Si, the field-induced shift of the free exciton transition is studied in the high-field limit. We find an excellent agreement of GaAs:Si with a formerly published value of intrinsic GaAs which was determined with the same method. In both cases, the reduced mass values are enhanced by 20% in comparison to the accepted reduced mass values of GaAs. The determined GaAsN masses are 1.5 times larger than in GaAs:Si and match the rising trend of formerly reported electron effective masses of GaAsN.

In this thesis, we investigate optical and electrical properties of dilute nitride semiconductors GaAsN in pulsed magnetic fields up to 62 T. For the most part, the experiments are performed at the Dresden High Magnetic Field Laboratory (HLD). In the first part of this thesis, the electron effective mass of GaAsN is determined with a direct method for the first time. Cyclotron resonance (CR) absorption spectroscopy is performed in Si-doped GaAsN epilayers with a nitrogen content up to 0.2%. For the CR absorption study, we use the combination of the free-electron laser FELBE and pulsed magnetic fields at the HLD, both located at the Helmholtz-Zentrum Dresden-Rossendorf. A slight increase of the CR electron effective mass with N content is obtained. This result is in excellent agreement with calculations based on the band anticrossing model and the empirical tight-binding method. We also find an increase of the band nonparabolicity with increasing N concentration in agreement with our calculations of the energy dependent momentum effective mass. In the second part of this thesis, the photoluminescence (PL) characteristics of intrinsic GaAsN and n-doped GaAsN:Si is studied. The PL of intrinsic and very dilute GaAsN is characterized by both GaAs-related transitions and N-induced features. These distinct peaks merge into a broad spectral band of localized excitons (LEs) when the N content is increased. This so-called LE-band exhibits a partially delocalized character because of overlapping exciton wave functions and an efficient interexcitonic population transfer. Merged spectra dominate the PL of all Si-doped GaAsN samples. They have contributions of free and localized excitons and are consequently blue-shifted with respect to LE-bands of intrinsic GaAsN. The highly merged PL profiles of GaAsN:Si are studied systematically for the first time with temperature-dependent time-resolved PL. The PL decay is predominantly monoexponential and has a strong energy dispersion. In comparison to formerly reported values of intrinsic GaAsN epilayers, the determined decay times of GaAsN:Si are reduced by a factor of 10 because of enhanced Shockley-Read-Hall and possibly Auger recombinations. In the third part of this thesis, intrinsic and Si-doped GaAsN are investigated with magneto-PL in fields up to 62 T. A magneto-PL setup for pulsed magnetic fields of the HLD was built for this purpose. The blue-shift of LE-bands is studied in high magnetic fields in order to investigate its delocalized character. The blue-shift is diminished in intrinsic GaAsN at higher temperatures, which indicates that the interexcitonic population transfer is only active below a critical temperature 20 K < T < 50 K. A similar increase of the temperature has no significant impact on the partially delocalized character of the merged spectral band of GaAsN:Si. We conclude that the interexcitonic transfer of Si-doped GaAsN is more complex than in undoped GaAsN. In order to determine reduced masses of undoped GaAsN and GaAs:Si, the field-induced shift of the free exciton transition is studied in the high-field limit. We find an excellent agreement of GaAs:Si with a formerly published value of intrinsic GaAs which was determined with the same method. In both cases, the reduced mass values are enhanced by 20% in comparison to the accepted reduced mass values of GaAs. The determined GaAsN masses are 1.5 times larger than in GaAs:Si and match the rising trend of formerly reported electron effective masses of GaAsN.