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Thin film characterisation of polycrystalline II-IV display phosphor materials prepared by pulsed laser deposition and RF sputteringKarner, Christine January 1997 (has links)
No description available.
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Measurement of absolute quantum efficiency and its correlation with spontaneous emission rate in light emitting materials /Tam, Alan Man Chun. January 2009 (has links)
Includes bibliographical references (p. 115-120).
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High performance organic thin film semiconductor devices: light emission properties and resonant tunnelingbehaviorsZheng, Tianhang, Henry., 郑天航. January 2009 (has links)
published_or_final_version / Electrical and Electronic Engineering / Doctoral / Doctor of Philosophy
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Investigation of thin film properties of luminescent manganese doped zinc sulphideMcLaughlin, J. January 1993 (has links)
No description available.
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study on the role of UV-modified MEH-PPV in multi-colour polymer light emitting device using a bilayer emission structure. / UV改性的MEH-PPV在用雙層發光結構的多色聚合物發光器件的作用之研究 / A study on the role of UV-modified MEH-PPV in multi-colour polymer light emitting device using a bilayer emission structure. / UV gai xing de MEH-PPV zai yong shuang ceng fa guang jie gou de duo se ju he wu fa guang qi jian de zuo yong zhi yan jiuJanuary 2008 (has links)
Chan, Man Ki = UV改性的MEH-PPV在用雙層發光結構的多色聚合物發光器件的作用之研究 / 陳文基. / Thesis submitted in: October 2007. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2008. / Includes bibliographical references. / Text in English; abstracts in English and Chinese. / Chan, Man Ki = UV gai xing de MEH-PPV zai yong shuang ceng fa guang jie gou de duo se ju he wu fa guang qi jian de zuo yong zhi yan jiu / Chen Wenji. / Abstract --- p.i / 論文摘要 --- p.iii / Acknowledgements --- p.iv / Table of Contents --- p.v / List of Figures --- p.viii / List of Tables --- p.x / Chapter Chapter 1 --- Introduction --- p.1 / Chapter 1.1 --- History --- p.1 / Chapter 1.2 --- Conjugated polymers --- p.2 / Chapter 1.2.1 --- Structure and energy states --- p.2 / Chapter 1.2.2 --- Charge carriers --- p.4 / Chapter 1.2.3 --- Transport of charge carriers --- p.8 / Chapter 1.3 --- Polymer light emitting diodes --- p.8 / Chapter 1.3.1 --- Fabrication and operation --- p.8 / Chapter 1.3.2 --- Improvement of efficiency --- p.10 / Chapter 1.4 --- Full-colour display --- p.13 / Chapter 1.4.1 --- Three colour emissions --- p.13 / Chapter 1.4.2 --- Colour pixels --- p.15 / Chapter 1.5 --- Objectives of present studies --- p.17 / References --- p.20 / Chapter Chapter 2 --- Instrumentation and Experimental Procedures --- p.23 / Chapter 2.1 --- Nitrogen glove box --- p.23 / Chapter 2.2 --- High vacuum deposition system --- p.23 / Chapter 2.3 --- Fabrication of PLEDs --- p.24 / Chapter 2.3.1 --- Integrated fabrication system --- p.24 / Chapter 2.3.2 --- Fabrication procedure --- p.26 / Chapter 2.4 --- Keithley 236 source measure unit --- p.30 / Chapter 2.5 --- Photo Research SpectraColorimeter (PR-650 SpectraScan) --- p.30 / Chapter 2.6 --- Tensor Alpha Step 500 Profilometer --- p.31 / Chapter 2.7 --- Fourier Transform Infrared (FTIR) spectroscopy --- p.31 / Chapter 2.8 --- UV-visible spectroscopy --- p.33 / Chapter 2.9 --- Photoluminescence spectroscopy --- p.35 / References --- p.36 / Chapter Chapter 3 --- Intrinsic and UV-induced properties of MEH-PPV thin films --- p.37 / Chapter 3.1 --- Introduction --- p.37 / Chapter 3.2 --- FTIR studies of MEH-PPV thin films --- p.38 / Chapter 3.2.1 --- Sample preparation --- p.38 / Chapter 3.2.2 --- Results and discussion --- p.39 / Chapter 3.2.3 --- Summary --- p.45 / Chapter 3.3 --- Absorption and photoluminescence studies of MEH-PPV thin films --- p.45 / Chapter 3.3.1 --- Sample preparation --- p.45 / Chapter 3.3.2 --- Results and discussion --- p.46 / Chapter 3.3.3 --- Summary --- p.54 / Chapter 3.4 --- Current-voltage measurement of MEH-PPV thin films --- p.54 / Chapter 3.4.1 --- Sample preparation --- p.54 / Chapter 3.4.2 --- Results and discussion --- p.56 / Chapter 3.4.3 --- Remark --- p.62 / Chapter 3.4.4 --- Summary --- p.62 / Chapter 3.5 --- Conclusion --- p.63 / References --- p.64 / Chapter Chapter 4 --- Two-colour light emitting device using UV modified MEH-PPV layer --- p.67 / Chapter 4.1 --- Introduction --- p.67 / Chapter 4.2 --- Details of fabrication procedures --- p.68 / Chapter 4.3 --- Results and Discussion --- p.70 / Chapter 4.4 --- Conclusion --- p.80 / References --- p.82 / Chapter Chapter 5 --- Concluding remarks and future works --- p.83 / Chapter 5.1 --- Concluding remarks --- p.83 / Chapter 5.2 --- Future works --- p.84
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Characterization of organic light-emitting devicesNorris, Benjamin J. 11 June 1999 (has links)
In this thesis steady-state (i.e. steady-state with respect to the applied voltage waveform) transient current-transient voltage [i(t)-v(t)], transient brightness-transient current [b(t)-i(t)], transient brightness-transient voltage [b(t)-v(t)], transient current [i(t)], transient brightness [b(t)], and detrapped charge analysis are introduced as novel organic light emitting device (OLED) characterization methods. These analysis methods involve measurement of the instantaneous voltage [v(t)] across, the instantaneous current [i(t)] through, and the instantaneous brightness [b(t)] from an OLED when it is subjected to a bipolar, piecewise-linear applied voltage waveform. The utility of these characterization methods is demonstrated via comparison of different types of OLEDs and polymer light emitting devices (PLEDs) and from a preliminary study of OLED aging. Some of the device parameters obtained from these characterization methods include: OLED capacitance, accumulated charge, electron transport layer (ETL) thickness, hole transport layer (HTL) thickness, OLED thickness, parallel resistance, and series resistance. A current bump observed in i(t)-v(t) curves is attributed to the removal of accumulated hole charge from the ETL/HTL interface and is only observed in heterojunctions (i.e. OLEDs), not in single-layer devices (i.e. PLEDs). Using the characterization methods developed in this thesis, two important OLED device physics conclusions are obtained:
(1) Hole accumulation at the ETL/HTL interface plays an important role in establishing balanced charge injection of electrons and holes into the OLED. (2) The ETL
behaves as a leaky insulator while the HTL more efficiently conducts charge and acts as a voltage-dependent resistor.
A preliminary investigation of the aging properties of OLEDs is presented as further evidence of the utility of the novel characterization methods developed in this thesis. In general, aging is characterized by a softer turn on of the forward bias portions of i(t)-v(t) and b(t)-v(t) curves. Also, some aging recovery is possible if the OLEDs are subjected to a zero or reverse bias. / Graduation date: 2000
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Fabrication and characterization of ACTFEL devicesKeir, Paul D. 02 August 1999 (has links)
The goal of this thesis is the identification and synthesis of high-luminance,
primary color alternating-current thin-film electroluminescent (ACTFEL) devices.
Special attention is paid to the synthesis of primary color green ACTFEL devices because
of the lack of an adequate primary green ACTFEL phosphor and the dominance
of green wavelengths in the response of the human eye. The sulfide materials family
is the focus of this investigation of ACTFEL phosphor hosts due to its importance in
the field of electroluminescence, although oxide and selenide phosphor hosts are also
considered. Particular attention is paid to the coactivation of the SrS:Cu ACTFEL
phosphor because of the ability to control the emission spectrum with coactivators.
Green ACTFEL devices exhibiting a high-luminance, high-efficiency, saturated green
color are demonstrated via the coactivation of SrS:Cu with alkali metals. In addition,
Zn���GeO���:Mn is demonstrated as a potentially bright and stable ACTFEL phosphor.
Finally, the "phosphor sandwich" technique of ACTFEL fabrication is presented as
a means of depositing highly-stable, high-luminance ACTFEL phosphors.
The fabrication techniques presented in this thesis are subsequently employed
to deposit custom ACTFEL devices for characterization studies aimed at determining
fundamental physical properties of ACTFEL phosphors. A method for establishing
the relative hot electron distributions inside operating ACTFEL phosphor hosts is
presented. In addition, the fabrication of SrS:Cu ACTFEL devices for characterization has allowed new insight into the density and physical basis of phosphor space charge. This insight is gained by monitoring the electrical and optical characteristics of SrS:Cu ACTFEL devices coactivated with various non-isovalent impurities to assess the influence of native defects and extrinsic impurities on space charge related behavior. It is found that native sulfur vacancies are not the physical basis for dynamic space charge in SrS:Cu ACTFEL devices. / Graduation date: 2000
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Alternating-current thin-film electroluminescent device optical excitation experimentsCleary, Bradford A. 10 November 1998 (has links)
This thesis investigates two methods of optical excitation of alternating-current
thin-film electroluminescent (ACTFEL) devices. The two experimental methods investigated in this thesis are the photo-induced charge (PIQ) and luminescence (PIL),
and the subthreshold-voltage induced transferred charge (VIQ) techniques. PIQ/PIL
experiments utilize an above-bandgap laser pulse to investigate the transport properties
of photo-injected electrons and holes within the phosphor layer of the ACTFEL
device. VIQ experiments use a broadband xenon lamp pulse to optically reset traps
which are ionized by subthreshold bipolar voltage pulses. Both experiments characterize
traps within the phosphor layer.
PIQ/PIL experiments are performed on evaporated ZnS:Mn ACTFEL devices
possessing phosphor layers with thicknesses of 950, 700, and 300 nm. From the
PIQ/PIL experiment, an impact excitation threshold electric field for evaporated
ZnS:Mn is found to be ~1 MV/cm. Evidence of hole-trapping is also obtained from
the PIQ experiment. The holes in evaporated ZnS:Mn ACTFEL devices are found
to possess a drift length of ~180 �� 70 nm, a hole lifetime of ~2 ps, and a capture
cross-section of ~7 x 10������� cm��. It is speculated that the trap responsible for hole
capture is a zinc vacancy or zinc vacancy complex.
VIQ experiments are performed on evaporated, atomic layer epitaxy [ALE] (Cl),
and ALE (DEZ) ZnS:Mn ACTFEL devices. Data obtained via VIQ experiments yield
evidence for the generation of space charge below the EL conduction threshold, as well
as providing a means of estimating the physical location, energy depth, density, and
capture cross-section of traps responsible for VIQ. The depth of the traps responsible
for VIQ in evaporated, ALE (C1), and ALE (DEZ) ZnS:Mn are estimated to be ~1.1,
~0.3, and ~0.8 eV, respectively. It is speculated that the traps responsible for VIQ
are due to sulfur vacancies, chlorine, and oxygen, for evaporated, ALE (Cl), and
ALE (DEZ), respectively. / Graduation date: 1999
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Optical characterization of alternating-current thin-film electroluminescent phosphors and devicesLite, Kevin D. 23 April 1996 (has links)
Graduation date: 1997
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Electo-optic characterization of ZnS:Tb ACTFEL devices for probing the hot electron distributionStreicher, Keone R. 12 July 1994 (has links)
In this report, the optical characteristics of ZnS:Tb AC driven thin-film
electroluminescent devices are evaluated. Luminescence at low and room temperature
under a constant phosphor field is recorded in order to probe the hot electron energy
distribution. Samples fabricated by atomic layer epitaxy and by sputter deposition are
investigated and their differences and similarities evaluated. The ALE sample exhibits a
drastic increase in luminescence at low temperature, while the sputtered sample displays a
decrease in luminescence at low temperature. The reduction of optical phonon scattering
and nonradiative transition rates at low temperature are believed to be responsible for
these changes. Differences between ALE and sputtered samples are due to the different
fabrication methods. The approach suggested by Krupka in 1972 of determining the hot
electron energy distribution by taking the ratio intensities of two luminescent transitions
from different upper states in Tb�����, is shown to be inaccurate due to the possible
nonradiative transitions taking place. The Tb����� impact excitation quantum yield at a
wavelength of 489 nm is measured and is shown to agree with Monte Carlo simulations.
Saturation occurs due to the increase in band-to-band impact ionization at high phosphor
fields. / Graduation date: 1995
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