No description available.

Thesis (Ph.D.)--OGI School of Science & Engineering at OHSU, Feb. 2006. / Includes bibliographical references (leaves 111-115).

Thesis (M. Phil.)--Hong Kong University of Science and Technology, 2003. / Includes bibliographical references (leaves 126-131). Also available in electronic version. Access restricted to campus users.

Thesis (Ph.D.)--University of Nebraska-Lincoln, 2008. / Title from title screen (site viewed Oct. 31, 2008). PDF text: x, 336 p. : ill. (chiefly col.) ; 6 Mb. UMI publication number: AAT 3309211. Includes bibliographical references. Also available in microfilm and microfiche formats.

Thesis (Ph.D.)--University of Nebraska-Lincoln, 2010. / Title from title screen (site viewed June 22, 2010). PDF text: ca. 150 p. : ill. UMI publication number: AAT 3397631. Includes bibliographical references. Also available in microfilm and microfiche formats.

Orientador: Dario Antonio Donatti / Banca: Agnaldo Freschi / Banca: Ivan de Oliveira / Resumo: Com a finalidade de possuir um equipamento para determinar o índice de refração de xerogéis e a espessura de filmes finos preparados em nosso laboratório por técnica sol-gel, optamos pela construção de um sistema capaz de determinar a intensidade de luz refletida por uma amostra em função do ângulo de incidência, com controle do estado de polarização da componente incidente e monitoramento da polarização da componente refletida. Dessa forma temos um equipamento capaz de determinar o ângulo de Brewster e assim o índice de refração da amostra em estudo. O equipamento também permite identificar o estado de polarização da luz refletida (luz linearmente, elipticamente e circularmente polarizada) para diversos ângulos de incidência, constituindo assim um Elipsômetro. O sistema é composto de um suporte de amostra e um braço suporte do detector de luz, com movimento de rotação síncrono na razão amostra detector de f para 2f . Todo o mecanismo de acionamento dos motores de passo e aquisição de dados é controlado através das portas paralelas de um computador. A aquisição de dados é feita através de um Conversor Analógico Digital O software de controle dos motores e aquisição de dados foi desenvolvido em linguagem Basic em modo DOS. / Abstract: With the purpose of possessing an equipment to determine the index of xerogels refraction and the thickness of prepared fine films in our laboratory for technical sun-gel, we opted for the construction of a system capable to determine the light intensity contemplated by a sample in function of the incidence angle, with control of the state of polarization of the incident component and accompaniment of the polarization of the reflected component. In that way we have equipment capable to determine the angle of Brewster and like this the index of refraction of the sample in study. The equipment also allows identifying the state of polarization of the reflected light (it shines lineally, elliptical and circularly polarized) for several incidence angles, constituting like this an Ellipsometer. The system is composed of a sample support and an arm supports of the light detector, with synchronous rotation movement in the detecting of f reason sample for 2f . The whole mechanism of action of the step motors and acquisition of data is controlled through the parallel doors of a computer. The acquisition of data is made through an Analog-to-digital Converter. The software of control of the motors and acquisition of data was developed in language Basic in way DOS. / Mestre

No description available.

<p> The standard technique of ellipsometry allows the determination of the optical constants of a substrate material provided either the surface is free of an oxide film or the oxide film thickness and optical constants of this oxide film are known. The majority of ellipsometric measurements performed on materials known to grow natural oxides is done by removing the natural oxide (either by cleaving or etching) and performing the measurements at one angle of incidence in vacuo. These processes perturb the surface and the reported values of optical constants may be questionable. </p> <p> The technique to be presented here assumes the material to be studied has a naturally-occurring oxide. Measurements are performed at several angles of incidence and the optical equations are solved for a self-consistent oxide film thickness until the best fit substrate optical constants have been found. The optical constants of the oxide film are then determined. </p> / Thesis / Master of Science (MSc)

<p>This thesis describes the research I have done, and partly will do, during my time as a PhD student in the laboratory of Applied Optics at Linköping University. Due to circumstances beyond the scope of this book, this incorporates three quite different projects. The first two, involving gas sensing and measuring on paper with ellipsometry, have been discontinued, whereas the third one, measuring fluorescence with a computer screen and web camera, is in full progress and will be until I complete my studies.</p><p>Thus the purpose of this work also has several aspects. Partly, it describes performed research and its results, as well as theoretical background. On the other hand, it provides practical and theoretical background necessary for future work. While the three projects are truly quite different, each of them has certain things in common with each of the other. This is certainly also true for the necessary theory. Two of them involve spectroscopic ellipsometry, for example, while another pair needs knowledge of color theory, etc. This makes it impossible to separate the projects, despite of their differences. Hopefully, these links between the different projects, connecting the different chapters, will make this work whole and consistent in its own way.</p> / Report code: LiU-TEK-LIC-200 4-19. On the day of the public defence the status of article I was: In press and the status of article III was: Manuscript and has a new title. The old title was Computer screen photo-assisted spectroscopic fluorimetry.

No description available.