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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

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Ballistic Electron Emission Microscopy and Internal Photoemission Study on Metal Bi-layer/Oxide/Si, High-<i>k</i> Oxide/Si, and “End-on” Metal Contacts to Vertical Si Nanowires

Cai, Wei 25 August 2010 (has links)
No description available.
Physics
ballistic electron emission microscopy
BEEM
internal photoemission
metal-bialyer/SiO2 interface
high-k oxide/Si
metal/oxide/semiconductor
end-on metal contact
vertical Si NWs
current suppression
Schottky barrier
interface state charge

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