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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

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A Degradation-based Burn-in Optimization for Light Display Devices with Two-phase Degradation Patterns considering Warranty Durations and Measurement Errors

Gao, Yong January 2017 (has links)
No description available.
Industrial Engineering
burn-in
degradation modeling
degradation-based burn-in
Gibbs sampling
hierarchical Bayesian model
Monte Carlo simulation
reliability
optimization
warranty duration
measurement errors
two-phase degradation patterns
light display devices

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