ITC/USA 2010 Conference Proceedings / The Forty-Sixth Annual International Telemetering Conference and Technical Exhibition / October 25-28, 2010 / Town and Country Resort & Convention Center, San Diego, California / The complexity of modern test and evaluation (T&E) processes has resulted in an explosion of the quantity and diversity of metadata used to describe end-to-end T&E processes. Ideally, it would be possible to integrate metadata in such a way that disparate systems can seamlessly access the metadata and easily interoperate with other systems. Unfortunately, there are several barriers to achieving this goal: metadata is often designed for use with specific tools or specific purposes; metadata exists in a variety of formats (legacy, non-legacy, structured and unstructured metadata); and the same information is represented in multiple ways across different metadata formats.