This dissertation proposes a new framework to characterize the nonlinear behavior of anisotropic materials in an on-line manner. The proposed framework applies recursive estimation and a multi-linear model to characterize the nonlinear behavior of anisotropic materials on-line using full-field strains, which are capable of capturing the multi-axial information of anisotropic materials. A stochastic method is developed to characterize the linear behavior of anisotropic materials under the influence of full-field strain measurement noise. This method first derives stochastic equations based on the formulas of energy-based characterization that utilizes the principle of ener-gy conservation, and then recursively estimates elastic constants at every acquisition of measure-ment using a Kalman filter (KF). Since the measurement model is expressed nonlinearly, the KF utilizes a Kalman gain, which is newly derived in this dissertation through variance minimization, to achieve optimal characterization. The aforementioned method, namely stochastic linear characteri-zation in this dissertation, becomes a basis of the multi-linear characterization method. This method utilizes a multi-linear model, which is defined by partitions, to characterize the nonlinear constitu-tive relations. The multi-linear characterization scales up the number of estimates and identifies the coefficients of each linear partition using the previously derived KF. The recursive updates in measurements not only removes uncertainty through sensor measurements, but also enables the on-line capability of the nonlinear characterization of anisotropic materials. A series of numerical and experimental studies were performed to demonstrate the performance of the proposed framework in characterizing the nonlinear behavior of anisotropic materials. The validity and applicability of the proposed framework were confirmed by the comparison with the known values of the characterized constitutive relations. It was found that the proposed framework identified elastic constants that were in good agreement with known values irrespective of the spec-imen geometry. The results of the multi-linear characterization method were well correlated with known nonlinear stress-strain relations and concluded that the proposed framework is capable of characterizing adequate nonlinear behavior on-line. / Ph. D.

Submitted by Alison Vanceto (alison-vanceto@hotmail.com) on 2017-06-08T17:59:02Z No. of bitstreams: 1 DissTMG.pdf: 5915699 bytes, checksum: 6ec0af39899ad70e102eda93fa21e0e0 (MD5) / Approved for entry into archive by Ronildo Prado (ronisp@ufscar.br) on 2017-06-14T13:47:59Z (GMT) No. of bitstreams: 1 DissTMG.pdf: 5915699 bytes, checksum: 6ec0af39899ad70e102eda93fa21e0e0 (MD5) / Approved for entry into archive by Ronildo Prado (ronisp@ufscar.br) on 2017-06-14T13:48:05Z (GMT) No. of bitstreams: 1 DissTMG.pdf: 5915699 bytes, checksum: 6ec0af39899ad70e102eda93fa21e0e0 (MD5) / Made available in DSpace on 2017-06-14T13:55:25Z (GMT). No. of bitstreams: 1 DissTMG.pdf: 5915699 bytes, checksum: 6ec0af39899ad70e102eda93fa21e0e0 (MD5) Previous issue date: 2015-02-27 / Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) / The morphology of extruded multiphase polymer systems is usually assessed through off-line characterization methods such as microscopy, which require much time for sample preparation and analysis of the results. This work aimed to the improvement of an optical detector to measure in real time the morphology of blends and polymeric composites in processing by extrusion, by laser light scattering at low angle (LALLS). Such equipment includes hardware and software and is based on measuring the intensity of light from a laser and is spread across and under the melt flow. The signals are collected by an array 91 of photodetectors sent to a computer, and displayed in real time on a three- dimensional plot of scattered light intensity to form a surface defined by 321 points. When analyzing the scattering profile valuable information can be determined that help to elucidate the morphology of the second phase particles. The LALLS detector was tested on bench using standard samples, which were prepared so that one of its parameters (orientation, second phase concentration, dispersed particle size or type of dispersed particle) were known. This allowed the systematic study of these samples and the detector device validation. Finally, the device was tested in real time on the extrusion process, and under different materials and operating conditions. Thus, the LALLS detector device created by the group was improved making it possible to evaluate in a practical way and in real time polymer blends in solid films and morphology of some blends and polymeric composites during extrusion. / A morfologia de sistemas poliméricos polifásicos é usualmente avaliada através de métodos de caracterização off-line, tal como a microscopia, os quais demandam muito tempo para a preparação das amostras e para a análise dos resultados. Este trabalho teve como principal objetivo o aperfeiçoamento de um detector óptico para medida em tempo real da morfologia de misturas e compostos poliméricos no processamento por extrusão, através do espalhamento de luz laser em baixo ângulo (LALLS). Tal equipamento inclui hardware e software e baseia-se na medida da intensidade da luz que provém de um laser e que é espalhada através do material fundido e sob fluxo. Os sinais são coletados por um arranjo de 91 fotodetectores, enviados a um computador, e apresentados em tempo real num gráfico tridimensional da intensidade de luz espalhada formando uma superfície definida por 321 pontos. Ao se analisar o perfil de espalhamento tem-se valiosas informações que ajudam elucidar a morfologia das partículas de segunda fase presentes. O detector de LALLS foi testado em bancada com o uso de amostras-padrão, as quais foram elaboradas de maneira que um de seus parâmetros (orientação, concentração de segunda fase, tamanho de partícula dispersa ou tipo de partícula dispersa) tivesse sido alterado de forma conhecida. Isso permitiu o estudo sistematizado dessas amostras e a validação do dispositivo detector. Por fim, o dispositivo foi testado em tempo real no processo de extrusão, sob diferentes condições materiais e de operação. Com isso, o dispositivo detector de LALLS criado pelo grupo foi aperfeiçoado possibilitando avaliar-se de forma prática e em tempo real: a morfologia de misturas poliméricas na forma de filmes sólidos e algumas misturas e compostos poliméricos durante a extrusão.

Manufacturing of precise structures in MEMS, semiconductors, optics and other fields requires high standards in manufacturing and quality control. Appropriate surface topography measurement technologies should therefore deliver nm accuracy in the axial dimension under typical industrial conditions. This work shows the characterization of a dispersion-encoded low-coherence interferometer for the purpose of fast and robust surface topography measurements. The key component of the interferometer is an element with known dispersion. This dispersive element delivers a controlled phase variation in relation to the surface height variation which can be detected in the spectral domain. A laboratory setup equipped with a broadband light source (200 - 1100 nm) was established. Experiments have been carried out on a silicon-based standard with height steps of 100 nm under different thermal conditions such as 293.15 K and 303.15 K. Additionally, the stability of the setup was studied over periods of 5 hours (with constant temperature) and 15 hours (with linear increasing temperature). The analyzed data showed that a height measurement of 97.99 ± 4:9nm for 293.15 K and of 101.43 ± 3:3nm for 303.15 K was possible. The time-resolved measurements revealed that the developed setup is highly stable against small thermal uctuations and shows a linear behaviour under increasing thermal load. Calibration data for the mathmatical corrections under different thermal conditions was obtained.

This work introduces a modified low-coherence interferometry approach for nanometer surface-profilometry. The key component of the interferometer is an element with known dispersion which defines the measurement range as well as the resolution. This dispersive element delivers a controlled phase variation which can be detected in the spectral domain and used to reconstruct height differences on a sample. In the chosen setup, both axial resolution and measurement range are tunable by the choice of the dispersive element. The basic working principle was demonstrated by a laboratory setup equipped with a supercontinuum light source (Δλ = 400 ̶ 1700 nm). Initial experiments were carried out to characterize steps of 101 nm on a silicon height standard. The results showed that the system delivers an accuracy of about 11.8 nm. These measurements also served as a calibration for the second set of measurements. The second experiment consisted of the measurement of the bevel of a silicon wafer. The modified low-coherence interferometer could be utilized to reproduce the slope on the edge within the previously estimated accuracy. The main advantage of the proposed measurement approach is the possibility to collect data without the need for mechanically moving parts.

Within this work a scan-free, low-coherence interferometry approach for surface profilometry with nm-precision is presented. The basic setup consist of a Michelson-type interferometer which is powered by a supercontinuum light-source (Δλ = 400 - 1700 nm). The introduction of an element with known dispersion delivers a controlled phase variation which can be detected in the spectral domain and used to reconstruct height differences on a sample. In order to enable scan-free measurements, the interference signal is spectrally decomposed with a grating and imaged onto a two-dimensional detector. One dimension of this detector records spectral, and therefore height information, while the other dimension stores the spatial position of the corresponding height values. In experiments on a height standard, it could be shown that the setup is capable of recording multiple height steps of 101 nm over a range of 500 µm with an accuracy of about 11.5 nm. Further experiments on conductive paths of a micro-electro-mechanical systems (MEMS) pressure sensor demonstrated that the approach is also suitable to precisely characterize nanometer-sized structures on production-relevant components. The main advantage of the proposed measurement approach is the possibility to collect precise height information over a line on a surface without the need for scanning. This feature makes it interesting for a production-accompanying metrology.