1 |
On Dual Actuation in Atomic Force MicroscopesEl Rifai, Khalid, El Rifai, Osamah M., Youcef-Toumi, Kamal 01 1900 (has links)
In this paper, the problem of dual actuation in the atomic force microscope (AFM) is analyzed. The use of two actuators to balance the trade-off between bandwidth, range, and precision has been recently extended to nano-positioning systems. Despite existing demands, this concept undergoes fundamental limitations towards its extension to AFMs. This is attributed to the non-conventional requirement imposed on the control signal response, as it used to create the image of the characterized surface. / Singapore-MIT Alliance (SMA)
|
Page generated in 0.1211 seconds