This Master´s thesis is about ways of packages of integration circuits and modules. Especially it´s about non-hermetic types of packages. One part of this paper are basic information about packaging and aspects in design of package. Next parts are design of test samples, which are package to epoxide powder material. Based on the results of the tests method, it will propose, where the technology will be used.

The present work deals with the design and manufacturing of 3D structures in LTCC (Low Temperatue Cofired Ceramics) technology. To use this technology LTCC workplaces have been designed and technological processes for high quality reproducible production were suggested. Technological possibilities of low temperature co-fired ceramics were demonstrated in the design and manufacturing of pressure sensors, electrode systems for ozone generators, planar circuit elements (coils and transformers) and in the design a special package for middle-power terahertz modulator. Design of selected parts of respective devices was proved by simulations in COMSOL Multiphysics. The work provides new insights into the structure of power integrated circuits sleeves and structure of electrode systems for different types of electrical discharges. Results of this work can contribute significantly in the application of planar circuit elements, in the development of different types of sensors, in the design of atypical types of packaging or in the design of electrode systems for capacitive coupled electrical discharges.

This diploma thesis is focused on detecting of defects on BGA (Ball Grid Array) components using of X-ray. Defects are formed during reflow BGA components during assembly, but also later due to mechanical and thermal stress. Therefore, there is an overview of defects and methods of diagnosis of BGA packages eg .: modern X-ray defect detection or micro sections. There is disclosed a device NORDSON DAGE XD7600NT its operation and setup. The device enables advanced methods of scanning called X-plane. For creating 3D models used reconstructive software called CERA, which uses raw data from the method of X-Plane.

This thesis is focused on BGA packages and fault detection after rework using X – Ray. There is a description of BGA packages by carrier substrate, techniques of connecting on chip, from mounting packages to repair printed circuit boards (hereafter PCB). Thesis summarizes description of defects, which are created after rework process. There is also description of X – Ray as method for analyzing defects. X – PLANE method used to detect internal structure of BGA packages and it was confirmed by microsection and by software for reconstruction. Description of automatic and manual measurement is follow.