This thesis is concerned with a quantitative study of intermixing in GaAs/AlGaAs and ZnSe/ZnCdSe single quantum well semiconductor structures. In this study, a method of iterative isothermal anneals and photoluminescence used to characterize this phenomenon has enabled the evolution of the diffusion coefficients for the interdiffusion process with anneal time to be followed. The blue-shift emissions arising from this method are predicted by a model based on Fick's law of diffusion. This model is developed in an attempt to relate the energy shift that is observed experimentally to the diffusion length. The mixing is modelled using an error function expression to solve the diffusion equation so as to describe the variation in well shape which is attributed to compositional disordering induced during thermal processing. Using this approach, where evidence of intermixing was monitored, the emission would be expected to shift measurably. Data has been taken to cover a wide temperature range to establish values for the activation energy EA. From this data, it has been found that the diffusion coefficients at various temperatures are thermally activated with an energy of 3.6 +/- 0.2 eV in GaAs/AlGaAs. The data is compared with the available literature data taken under a wide range of experimental conditions. We show that despite the range of activation energies quoted in the literature all the data appears to be consistent with a single activation energy. Departures from the 'mean' value are ascribed to experimental uncertainties in determining the diffusion coefficients for example, to fluctuations in the composition of the material, to techniques used, or to a wide range of perturbations. Photoluminescence observations on ZnSe/ZnCdSe show that an improvement in the optical quality of these quantum well structures was found for anneals at temperatures (~500°C). A value of EA = 2.9 +/- 0.3 eV was derived from the experiments for the interdiffusion process over a 250 K temperature range and four decades of interdiffusion coefficient. The interdiffusion process of both these systems was inferred to be Fickian with no dependence on alloy composition or strain.

This thesis reports on an extensive investigation into the intrinsic frequency response of various MQW lasers as determined from parasitic-free relative intensity noise (RIN) measurements. Eleven structures were designed, grown and fabricated at Nortel Technology's Advanced Technology Laboratory in Ottawa. Five of the laser structures had active regions containing 10 QWs. The barrier layer composition for these structures was varied such that the emission wavelength corresponding to the barrier band-gap increased from 1.0 pm to 1.2 pm in 0.05 pm steps. The remaining six structures had a constant barrier layer emission wavelength of 1.1 pm but the number of quantum wells was varied from 5, 7, 8 to 14 in 2 well steps. In all structures the QWs were embedded in a graded- index-separate-confinement-heterostructure waveguiding region and were strained to 1.0 percent in compression. The devices processed from these structures were Fabry-Perot type lasers having cavity lengths ranging from 254 pm to 1016 pm. Resonance frequency and damping values as a function of injection current and single facet optical power, as well as optical spectra just below threshold, were obtained for over one hundred devices. From this data the response coefficient D, K factor, group velocity (vg), photon energy (hv), mirror loss (am), and internal absorption (aint) were characterized. Using these characterized parameters dg/dN, dg/ds, and the maximum theoretical intrinsic 3 dB bandwidth (fmax) were calculated. The effects of varying QW number, barrier height, and cavity length on all these parameters was investigated. Limitations with using the single mode rate equation model for these characterizations is discussed. As well, potential limitations with the basic design of the structures studied in this thesis as revealed by the results are explored. / Thesis / Candidate in Philosophy

Optically pumped semiconductor lasers (OPSLs) combine features including an engineerable emission wavelength, good beam quality, and scalable output power and are desirable for a wide variety of applications. Power scaling of OPSLs requires a combination of accurate epitaxial quantum design, accurate wafer growth and good thermal management. Here a fabrication process for OPSL devices was developed to ensure efficient OPSL device cooling and minimum surface scattering. A systematic thermal analysis was performed to optimize thermal management. Strategies for optimizing power extraction were developed; including increasing the gain/micro-cavity detuning that increases the threshold but also increases the slope efficiency and the roll-over temperature, recycling the excess pump via reflection from a metalized reflector at the back of a transparent DBR, anti-reflection coating at the pump wavelength while preserving the signal micro-cavity resonance. With optimized thermal management and the strategy of using large gain/micro-cavity detuning structure, a CW output power of 103 W from a single OPSL device was achieved. 42% optical-to-optical efficiency from the net pump power was obtained from the OPSL device with the double pass pump design and 39% optical-to-optical efficiency with respect to the total pump power was obtained with the new pump anti-reflection coating. For the fundamental mode operation, over 27 W of CW output power was achieved. To our knowledge, this is the highest 1 µm TEM₀₀ mode power reported to date for an OPSL. Finally, strategies for generating high peak power are also discussed. A maximum peak power of over 270 W was achieved using 750 ns pump pulses.

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Room temperature vertical cavity lasing at the wavelength of 433nm has been successfully realized in InxGa₁₋xN/InyGa₁₋yN multiple quantum well without Bragg mirrors under photo-excitation. At high excitation intensity, one of the modes of the Fabry-Perot cavity formed by the GaN/sapphire and the GaN/air interfaces, shows a strong superlinear increase in intensity with excitation intensity rise. The vertical cavity surface emitting laser (VCSELs) structure is grown by metal-organic chemical vapor phase deposition and the threshold is as low as 200kW/cm². The lasing in the sample probably results from the ultrahigh material gain due to the spontaneous formation of dense array of nanoscale InGaN quantum dots (QDs) having an exceptional high area density. / Singapore-MIT Alliance (SMA)