Highly coherent light, although beneficial in specific applications, suffers from the formation of speckles, resulting in poor imaging, lighting, and projection/display quality. Moreover, the long coherence length limits the resolution in interference based sensing. This has led to the emergence of edge-emitting semiconductor low coherence light sources (e.g., broadband lasers, superluminescent diodes, etc.), which have been used in display applications, optical coherence tomography, and random bit generation. However, edge emission prevents the ease of fabricating two-dimensional arrays. Conversely, vertical-cavity surface-emitting lasers (VCSELs) have recently been widely used in consumer electronics due to the unique advantages of surface emission. Nevertheless, they still suffer from issues caused by high coherence. The aim of this dissertation is to design low-coherence surface-emitting lasers to push simultaneous illumination and optical wireless communication (OWC) toward reliable implementation with higher speeds. To that end, we demonstrate, for the first time, the use of chaotic cavities to lower the coherence of VCSELs without increasing their emission area, which would lower their speed. Not only did the chaotic cavity result in doubling the number of modes (lowering the coherence) compared to conventional VCSELs, but it also resulted in an increase in the optical power of up to 60%. We also show that chaotic-cavity broad-area VCSELs can achieve significantly broader modulation bandwidths (up to 5 GHz) and higher data rates (up to 12.6 Gb/s) compared to other low-coherence light sources, while achieving a lower speckle contrast. We further report a novel technique of lowering the speckle contrast 2 by carefully designing the AC signal used for communication. We show that the apparent spatial coherence is dramatically decreased by inserting a short chirp signal between symbols. Using this method with a chaotic-cavity VCSEL, the number of apparent modes can be up to 450 modes, compared to 88 modes measured from a conventional broad-area VCSEL. The simplicity of implementing the reported design, which requires no additional fabrication steps, makes it a promising solution for applications that would benefit from the lower speckle density of the emitted light as well as those that rely on lower temporal coherence.

La microscopie à éclairements structurés(structured illumination microscopy, SIM) permet de dépasser la limite de résolution en microscopie optique due à la diffraction, en éclairant l’objet avec un ensemble de motifs périodiques parfaitement connus. Cependant, il s’avère difficile de contrôler exactement la forme des motifs éclairants. Qui plus est, de fortes distorsions de la grille de lumière peuvent être générées par l’échantillon lui-même dans le volume d’étude, ce qui peut provoquer de forts artefacts dans les images reconstruites. Récemment, des approches dites blind-SIM ont été proposées, où les images sont acquises à partir de motifs d’éclairement inconnus, non-périodiques, de type speckle,bien plus faciles à générer en pratique. Le pouvoir de super résolution de ces méthodes a été observé, sans forcément être bien compris théoriquement. Cette thèse présente deux nouvelles méthodes de reconstruction en microscopie à éclairements structurés inconnus (blind speckle-SIM) : une approche conjointe et une approche marginale. Dans l’approche conjointe, nous estimons conjointement l’objet et les motifs d’éclairement au moyen d’un modèle de type Basis Pursuit DeNoising (BPDN) avec une régularisation en norme lp,q où p=>1 et 0<q<=1. La norme lp,q est introduite afin de prendre en compte une hypothèse de parcimonie sur l’objet. Dans l’approche marginale, nous reconstruisons uniquement l’objet et les motifs d’éclairement sont traités comme des paramètres de nuisance. Notre contribution est double. Premièrement, une analyse théorique démontre que l’exploitation des statistiques d’ordre deux des données permet d’accéder à un facteur de super résolution de deux, lorsque le support de la densité spectrale du speckle correspond au support fréquentiel de la fonction de transfert du microscope. Ensuite, nous abordons le problème du calcul numérique de la solution. Afin de réduire à la fois le coût de calcul et les ressources en mémoire, nous proposons un estimateur marginal à base de patches. L’élément clé de cette méthode à patches est de négliger l’information de corrélation entre les pixels appartenant à différents patches. Des résultats de simulations et en application à des données réelles démontrent la capacité de super résolution de nos méthodes. De plus, celles-ci peuvent être appliquées aussi bien sur des problèmes de reconstruction 2D d’échantillons fins, mais également sur des problèmes d’imagerie 3D d’objets plus épais. / Conventional structured illumination microscopy (SIM) can surpass the resolution limit inoptical microscopy caused by the diffraction effect, through illuminating the object with a set of perfectly known harmonic patterns. However, controlling the illumination patterns is a difficult task. Even worse, strongdistortions of the light grid can be induced by the sample within the investigated volume, which may give rise to strong artifacts in SIM reconstructed images. Recently, blind-SIM strategies were proposed, whereimages are acquired through unknown, non-harmonic,speckle illumination patterns, which are much easier to generate in practice. The super-resolution capacity of such approaches was observed, although it was not well understood theoretically. This thesis presents two new reconstruction methods in SIM using unknown speckle patterns (blind-speckle-SIM): one joint reconstruction approach and one marginal reconstruction approach. In the joint reconstruction approach, we estimate the object and the speckle patterns together by considering a basis pursuit denoising (BPDN) model with lp,q-norm regularization, with p=>1 and 0<q<=1. The lp,q-norm is introduced based on the sparsity assumption of the object. In the marginal approach, we only reconstruct the object, while the unknown speckle patterns are considered as nuisance parameters. Our contribution is two fold. First, a theoretical analysis demonstrates that using the second order statistics of the data, blind-speckle-SIM yields a super-resolution factor of two, provided that the support of the speckle spectral density equals the frequency support of the microscope point spread function. Then, numerical implementation is addressed. In order to reduce the computational burden and the memory requirement of the marginal approach, a patch-based marginal estimator is proposed. The key idea behind the patch-based estimator consists of neglecting the correlation information between pixels from different patches. Simulation results and experiments with real data demonstrate the super-resolution capacity of our methods. Moreover, our proposed methods can not only be applied in 2D super-resolution problems with thin samples, but are also compatible with 3D imaging problems of thick samples.