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Determination of magnitudes of modulating field:photoreflectance and electroreflectance on surface-intrinsic-n+ type doped GaAsLee, Wei-Yao 21 June 2000 (has links)
The photoreflectance(PR) and Electroreflectance(ER)
of surface-intrinsic-n+ type doped GaAs exhibit
many Franz-Keldysh oscillations (FKOs), which
enable the electric field (F) to be determined
from the technique of the fast Fourier transform
(FFT). It is known that F's determined from PR are
subjected to photovoltaic effect, but it is
difficult to estimate the strength of modulating
field (dF) of the pump beam in the PR measurements
. Alperovich et. al. have used imaginary part of
FFT to determine the strengths of dF's in the ER
measurements [V. L. Alperovich, et. al. Appl. Phys
. Lett. 71, 2788 (1997)]. Here, we will apply this
method to the PR measurements. The dF's thus
obtained will be compared with those deduced from
photo-voltage measurements. The result shows that
the method of Alperovich's can be used to
determine the strength of dF in the PR measurements.
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