<p>The technological development is enabling production of increasingly complex electronic systems. All those systems must be verified and tested to guarantee correct behavior. As the complexity grows, testing is becoming one of the most significant factors that contribute to the final product cost. The established low-level methods for hardware testing are not any more sufficient and more work has to be done at abstraction levels higher than the classical gate and register-transfer levels. This thesis reports on one such work that deals in particular with high-level test generation and design for testability techniques.</p><p>The contribution of this thesis is twofold. First, we investigate the possibilities of generating test vectors at the early stages of the design cycle, starting directly from the behavioral description and with limited knowledge about the final implementation architecture. We have developed for this purpose a novel hierarchical test generation algorithm and demonstrated the usefulness of the generated tests not only for manufacturing test but also for testability analysis.</p><p>The second part of the thesis concentrates on design for testability. As testing of modern complex electronic systems is a very expensive procedure, special structures for simplifying this process can be inserted into the system during the design phase. We have proposed for this purpose a novel hybrid built-in self-test architecture, which makes use of both pseudorandom and deterministic test patterns, and is appropriate for modern system-on-chip designs. We have also developed methods for optimizing hybrid built-in self-test solutions and demonstrated the feasibility and efficiency of the proposed technique.</p> / Report code: LiU-Tek-Lic-2002:46.

The technological development is enabling production of increasingly complex electronic systems. All those systems must be verified and tested to guarantee correct behavior. As the complexity grows, testing is becoming one of the most significant factors that contribute to the final product cost. The established low-level methods for hardware testing are not any more sufficient and more work has to be done at abstraction levels higher than the classical gate and register-transfer levels. This thesis reports on one such work that deals in particular with high-level test generation and design for testability techniques. The contribution of this thesis is twofold. First, we investigate the possibilities of generating test vectors at the early stages of the design cycle, starting directly from the behavioral description and with limited knowledge about the final implementation architecture. We have developed for this purpose a novel hierarchical test generation algorithm and demonstrated the usefulness of the generated tests not only for manufacturing test but also for testability analysis. The second part of the thesis concentrates on design for testability. As testing of modern complex electronic systems is a very expensive procedure, special structures for simplifying this process can be inserted into the system during the design phase. We have proposed for this purpose a novel hybrid built-in self-test architecture, which makes use of both pseudorandom and deterministic test patterns, and is appropriate for modern system-on-chip designs. We have also developed methods for optimizing hybrid built-in self-test solutions and demonstrated the feasibility and efficiency of the proposed technique. / <p>Report code: LiU-Tek-Lic-2002:46.</p>

This thesis deals with the possibilities of digital circuit test optimization using multifunctional logic gates. The most important part of this thesis is the explanation of the optimization principle, which is also described by a formal mathematical apparatus. Based on this apparatus, the work presents several options. The optimization of testability analogous to inserting test points and  simple methodology based on SCOAP is shown. The focus of work is a methodology created to optimize circuit tests. It was implemented in the form of software tools. Presented in this work are the results of using these tools to reduce the test vectors volume while maintaining fault coverage on various circuits, including circuits from the ISCAS 85 test set. Part of the work is devoted to the various principles and technology of creating multifunctional logic gates. Some selected gates of these technologies are subject to simulations of electronic properties in SPICE. Based on the principles of presented methodology and results of multifunctional gates simulations, analysis of various problems such as validity of the modified circuit test and the suitability of each multifunctional gate technology for the methodology was also made. The results of analysis and experiments confirm it is possible for the multifunctional logic gate to optimize circuit diagnostic properties in such a way that has achieved the required circuit test parameter modification with minimum impact on the quality and credibility of these tests.