Given the continuing deployment of total quality control and total quality management initiatives by organizations, employees have seen changes in their work environment. Furthermore, the impact of downsizing has resulted in operators becoming responsible for the quality of their own processes. This study tested the impact of various display alternatives of control chart data on decision performance and mental workload.  The control charts were shown as multiple two dimensional displays, a composite two dimensional display, and a composite three dimensional perspective display. Multiple two dimensional displays were found to have significantly higher decision accuracy and decision confidence ratings than either composite displays. No significant difference in decision accuracy and decision confidence ratings was found among the composite displays. The type of display did not have a significant effect on decision time. Mental workload was also found to be significantly affected by the type of display used. Multiple two dimensional displays imposed significantly lower levels of mental workload than either composite display. No significant difference in mental workload was found among the composite displays. These results indicated that multiple two dimensional displays should be used when control chart data from multiple processes must be displayed. / Master of Science

During the last decade ferroelectrics based on doped hafnium oxide emerged as promising candidates for realization of ultra-low-power non-volatile memories. Two spontaneous polarization states occurring in the material that can be altered by applying electrical fields rather than forcing a current through and the materials compatibility to CMOS processing are the main benefits setting the concept apart from other emerging memories. 1T1C ferroelectric random access memories (FeRAM) as well as 1T FeFET concepts are under investigation. In this article the application of hafnium based ferroelectric memories in different flavours and their ranking in the memory landscape are discussed.