The combination of analytical sensitivity and selectivity provided by time-of-flight secondary ion mass spectrometry (ToF-SIMS), with advanced statistical interrogation by principal component analysis (PCA), has allowed a significant advancement in the forensic discrimination of pen, pencil and glass materials based on trace characterisation.
| Identifer | oai:union.ndltd.org:ADTP/269012 |
| Date | January 2007 |
| Creators | Denman, John A |
| Source Sets | Australiasian Digital Theses Program |
| Language | EN-AUS |
| Detected Language | English |
| Rights | Copyright John Denman 2007 |
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