Return to search

Quantitative defect spectroscopy on operating AlGaN/GaN high electron mobility transistors

No description available.
Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:osu1259597046
Date January 2009
CreatorsMalonis, Andrew C.
PublisherThe Ohio State University / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageEnglish
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=osu1259597046
Rightsunrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

Page generated in 0.0031 seconds