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Structure-induced optical anisotropy in thin films

We consider in this work the contribution of anisotropic microstructure to polarization effects in thin films. The microstructute is pictured by a simple model as composed of identical columns with elliptical cross section elongated in a direction perpendicular to that of the vapor incidence.

Identiferoai:union.ndltd.org:IBICT/oai:lume.ufrgs.br:10183/157244
Date January 1983
CreatorsHorowitz, Flavio
ContributorsUniversity of Arizona. Graduate College, Macleod, H. Angus
Source SetsIBICT Brazilian ETDs
LanguageEnglish
Detected LanguageEnglish
Typeinfo:eu-repo/semantics/publishedVersion, info:eu-repo/semantics/doctoralThesis
Formatapplication/pdf
Sourcereponame:Biblioteca Digital de Teses e Dissertações da UFRGS, instname:Universidade Federal do Rio Grande do Sul, instacron:UFRGS
Rightsinfo:eu-repo/semantics/openAccess

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