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From X-ray diffraction data annealing to comprehensive charge density analysis

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Identiferoai:union.ndltd.org:uni-goettingen.de/oai:ediss.uni-goettingen.de:11858/00-1735-0000-0001-BBE1-7
Date01 July 2013
CreatorsHey, Jakob
ContributorsStalke, Dietmar Prof. Dr.
PublisherNiedersächsische Staats- und Universitätsbibliothek Göttingen
Source SetsGeorg-August-Universität Göttingen
LanguageEnglish
Detected LanguageEnglish
TypedoctoralThesis

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