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A Degradation-based Burn-in Optimization for Light Display Devices with Two-phase Degradation Patterns considering Warranty Durations and Measurement Errors

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Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:ohiou1509109739168013
Date January 2017
CreatorsGao, Yong
PublisherOhio University / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageEnglish
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=ohiou1509109739168013
Rightsunrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

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