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Scanning Probe Microscopy Measurements and Simulations of Traps and Schottky Barrier Heights of Gallium Nitride and Gallium Oxide

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Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:osu1576715425331868
Date07 October 2020
CreatorsGaliano, Kevin
PublisherThe Ohio State University / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageEnglish
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=osu1576715425331868
Rightsrestricted--full text unavailable until 2025-05-13, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

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