NDLTD Global ETD Search
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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

Search results

Showing 1 to 2 of 2 (0.019 seconds)
1

Scanning Probe Microscopy Measurements and Simulations of Traps and Schottky Barrier Heights of Gallium Nitride and Gallium Oxide

Galiano, Kevin 07 October 2020 (has links)
No description available.
Physics
Scanning Probe Microscopy
Deep Level Transient Spectroscopy
SP-DLTS
Scanning Tunneling Microscopy
Ballistic Electron Emission Microscopy
Semiconductors
Materials Characterization
Finite Element Analysis
COMSOL Multiphysics Simulations
2

Scanned Probe Spectroscopy of Traps in Cross-Sectioned AlGaN/GaN Devices

Gleason, Darryl A. 04 September 2019 (has links)
No description available.
Physics
Electrical Engineering
gallium nitride
GaN
aluminum gallium nitride
AlGaN
high electron mobility transistor
HEMT
deep-level transient spectroscopy
DLTS
SP-DLTS
cross-sectioned
defect
deep level
trap
trapped charge

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