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A Comprehensive Test and Diagnostic Strategy for TCAMs

Content addressable memories (CAMs) are gaining popularity with computer networks. Testing costs of CAMs are extremely high owing to their unique configuration. In this thesis, a fault analysis is carried out on an industrial ternary CAM (TCAM) design, and search path test algorithms are designed. The proposed algorithms are able to test the TCAM array, multiple-match resolver (MMR), and match address encoder (MAE). The tests represent a 6x decrease in test complexity compared to existing algorithms, while dramatically improving fault coverage.

Identiferoai:union.ndltd.org:WATERLOO/oai:uwspace.uwaterloo.ca:10012/809
Date January 2005
CreatorsWright, Derek
PublisherUniversity of Waterloo
Source SetsUniversity of Waterloo Electronic Theses Repository
LanguageEnglish
Detected LanguageEnglish
TypeThesis or Dissertation
Formatapplication/pdf, 367597 bytes, application/pdf
RightsCopyright: 2005, Wright, Derek. All rights reserved.

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