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Modeling of integrated circuit interconnect dielectric reliability based on the physical design characteristics

Thesis (Ph. D.)--Electrical and Computer Engineering, Georgia Institute of Technology, 2007. / Linda Milor, Committee Chair ; Gary May, Committee Member ; Russell Dupuis, Committee Member ; Sung-Kyu Lim, Committee Member ; Mei-Yin Chou, Committee Member.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/80743198
Date January 2006
CreatorsHong, Changsoo.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceAvailable online, Georgia Institute of Technology, 2006.

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