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Interface state characterization techniques for MOS capacitors incorporating ultra-thin dielectric films /

Thesis (M.S.)--University of Minnesota, 2001. / "Accompanying CD-ROM contains Excel spreadsheets and Mathematica notebooks that contain data and templates" for further investigation.--P. 68. Includes bibliographical references (leaves 70-71). Also available on the World Wide Web as a PDF file.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/49360138
Date January 2001
CreatorsGabrys, Ann M.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeElectronic dissertations.
SourceON-CAMPUS Access For University of Minnesota, Twin Cities Click on "Connect to Digital Dissertations"

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