Thesis (M.S.)--Auburn University, 2008. / Abstract. Vita. Includes bibliographical references (p. 31).

A phase sensitive measurement technique that permits the simultaneous determination of two independent thermal properties of thin dielectric films is presented. Applying the technique results in a film's thermal diffusivity and effusivity, from which the thermal conductivity and specific heat can be calculated. The technique involves measuring a specimen's front surface temperature response to a periodic heating signal. The heating signal is produced by passing current through a thin layer of nichrome that is deposited on the specimen's surface, and the temperature response is measured with a HgCdTe infrared detector operating at 77 K. The signal that is produced by the infrared detector is first conditioned, and then sent to a lock-in amplifier. The lock-in is used to extract the phase shift present between the temperature and heating signal through a frequency range of 500 Hz-20 kHz. The corresponding phase data is fit to an analytical model using thermal diffusivity and effusivity as fitting parameters. The method has been applied effectively to 1.72 ��m films of Si0��� that have been thermally grown on a silicon substrate. Thermal properties have been obtained through a temperature range of 25��C-300��C. One unanticipated outcome stemming from analysis of the experimental data is the ability to extract both the thermal conductivity and specific heat of a thin film from phase information alone, with no need for signal magnitude. This improves the overall utility of the measurement process and provides a 'clean', direct path with fewer assumptions between data and final results. The thermal properties determined so far with this method are consistent with past work on Si0��� films. / Graduation date: 1998

Thesis (Ph.D.)--University of Nebraska-Lincoln, 2007. / Title from title screen (site viewed Nov. 9, 2007). PDF text: iv, 129 p. : ill. ; 5 Mb. UMI publication number: AAT 3266778. Includes bibliographical references. Also available in microfilm and microfiche formats.

Thesis (M.S.)--Oregon State University, 2010. / Printout. Includes bibliographical references (leaves 86-88). Also available on the World Wide Web.

No description available.

Thesis (M.S.)--University of Minnesota, 2001. / "Accompanying CD-ROM contains Excel spreadsheets and Mathematica notebooks that contain data and templates" for further investigation.--P. 68. Includes bibliographical references (leaves 70-71). Also available on the World Wide Web as a PDF file.

Thesis (Ph. D.)--University of Texas at Austin, 2000. / Vita. Includes bibliographical references (leaves 164-173). Available also in a digital version from Dissertation Abstracts.

Thesis (M.S.)--Rochester Institute of Technology, 1995. / Typescript. Includes bibliographical references.

Thesis (Ph. D.)--Ohio State University, 2005. / Title from first page of PDF file. Document formatted into pages; contains xx, 187 p.; also includes graphics (some col.). Includes bibliographical references (p. 174-187). Available online via OhioLINK's ETD Center

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