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Numerical modeling of very thin dielectric materialsKillian, Tyler Norton, Rao, S. M. January 2008 (has links) (PDF)
Thesis (M.S.)--Auburn University, 2008. / Abstract. Vita. Includes bibliographical references (p. 31).
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Thermal characterization technique for thin dielectric filmsIndermuehle, Scott W. 14 April 1998 (has links)
A phase sensitive measurement technique that permits the simultaneous determination
of two independent thermal properties of thin dielectric films is presented. Applying the technique results in a film's thermal diffusivity and effusivity, from which the thermal conductivity and specific heat can be calculated. The technique involves measuring a specimen's front surface temperature response to a periodic heating signal. The heating signal is produced by passing current through a thin layer of nichrome that is deposited on the specimen's surface, and the temperature response is measured with a HgCdTe infrared detector operating at 77 K. The signal that is produced by the infrared detector is first conditioned, and then sent to a lock-in amplifier. The lock-in is used to extract the phase shift present between the temperature and heating signal through a frequency range of 500 Hz-20 kHz. The corresponding phase data is fit to an analytical model using thermal diffusivity and effusivity as fitting parameters. The method has been applied effectively to 1.72 ��m films of Si0��� that have been thermally grown on a silicon substrate. Thermal properties have been obtained through a temperature range of 25��C-300��C. One unanticipated outcome stemming from analysis of the experimental data is the ability to extract both the thermal conductivity and specific heat of a thin film from phase information alone, with no need for signal magnitude. This improves the overall utility of the measurement process and provides a 'clean', direct path with fewer assumptions between data and final results. The thermal properties determined so far with this method are consistent with past work on Si0��� films. / Graduation date: 1998
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Cross linking molecular systems to form ultrathin dielectric layersFeng, Danqin January 1900 (has links)
Thesis (Ph.D.)--University of Nebraska-Lincoln, 2007. / Title from title screen (site viewed Nov. 9, 2007). PDF text: iv, 129 p. : ill. ; 5 Mb. UMI publication number: AAT 3266778. Includes bibliographical references. Also available in microfilm and microfiche formats.
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Bi-based perovskite solid solutions for high energy density thin films /Emerson, Morgan Rose. January 1900 (has links)
Thesis (M.S.)--Oregon State University, 2010. / Printout. Includes bibliographical references (leaves 86-88). Also available on the World Wide Web.
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LASER DAMAGE MEASUREMENTS ON ALL-DIELECTRIC NARROW-BAND FILTERS.DeSandre, Lewis Francis. January 1985 (has links)
No description available.
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Interface state characterization techniques for MOS capacitors incorporating ultra-thin dielectric films /Gabrys, Ann M. January 2001 (has links)
Thesis (M.S.)--University of Minnesota, 2001. / "Accompanying CD-ROM contains Excel spreadsheets and Mathematica notebooks that contain data and templates" for further investigation.--P. 68. Includes bibliographical references (leaves 70-71). Also available on the World Wide Web as a PDF file.
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Study of the thermal properties of low k dielectric thin films /Hu, Chuan, January 2000 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2000. / Vita. Includes bibliographical references (leaves 164-173). Available also in a digital version from Dissertation Abstracts.
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Tantalum oxide thin films for microelectronic applications /Jiang, Fang-Xing. January 1995 (has links)
Thesis (M.S.)--Rochester Institute of Technology, 1995. / Typescript. Includes bibliographical references.
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Studies on field effect transistors with conjugated polymer and high permittivity gate dielectrics using pulsed plasma polymerizationXu, Yifan. January 2005 (has links)
Thesis (Ph. D.)--Ohio State University, 2005. / Title from first page of PDF file. Document formatted into pages; contains xx, 187 p.; also includes graphics (some col.). Includes bibliographical references (p. 174-187). Available online via OhioLINK's ETD Center
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THREE TECHNIQUES FOR DETERMINING THE OPTICAL CONSTANTS OF DIELECTRIC THIN FILMSGarcia, Marie Frances, 1949- January 1986 (has links)
No description available.
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