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Selection of flip-flops for partial scan paths by use of a statistical testability measure /

Thesis (M.S.)--Virginia Polytechnic Institute and State University, 1992. / Vita. Abstract. Includes bibliographical references (leaves 60-62). Also available via the Internet.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/27701246
Date January 1992
CreatorsJett, David B.,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceThis resource online

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