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Algorithms to determine the positioning of built-in self-test structures in VLSI circuits with references to an economic model

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Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:280838
Date January 1989
CreatorsAustwick, Michael Steven
PublisherUniversity of Hull
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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