Return to search

A Degradation-based Burn-in Optimization for Light Display Devices with Two-phase Degradation Patterns considering Warranty Durations and Measurement Errors

No description available.

1. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1509109739168013

Identifer	oai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:ohiou1509109739168013
Date	January 2017
Creators	Gao, Yong
Publisher	Ohio University / OhioLINK
Source Sets	Ohiolink ETDs
Language	English
Detected Language	English
Type	text
Source	http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1509109739168013
Rights	unrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.