Abstract
With the advent of new technology, various machine structures and elements appear delicate and diminutive so that the nanotribological studies are needed in the modern mechanical technological development. Thin film lubrication will be indispensable as the basis of key-technology in high-technological devices and ultra-precision machines. Therefore, the research of thin film lubrication in the nanometer order is very important.
In this research uses a self-development optical elastohydrodynamic lubrication (EHL) tester to simulate the oil film characteristics in the contact region between steel ball and sapphire under the pure rolling condition. First, the variation of oil film thickness on the contact region is observed by using the optical interference principle. An inverse approach of EHL is employed to investigate the pressure distribution on the contact region of lubricant. Final, the oil thickness and pressure distribution are substituted into Reynolds equation to predict the pressure-viscosity index of lubricant.
Results show that the oil film thickness increases with increasing rolling speed, and curvature radius of steel ball, but decreases with increasing load. Moreover, when the oil thickness of ester lubricant is less than 17nm, the film thickness is obviously deviated that predicted by the classical EHL theory, and the pressure-viscosity index increases from 0.8195 to 0.9093. This result indicates that the ratio of the adsorbent layer to the oil film increases and causes the increase of the lubricant viscosity.
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0731103-161832 |
| Date | 31 July 2003 |
| Creators | Huang, Bi-Wei |
| Contributors | none, none, Jen-Fin Lin, Chiou, Yuang-Cherng |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | Cholon |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0731103-161832 |
| Rights | unrestricted, Copyright information available at source archive |
Page generated in 0.0021 seconds