With electronic devices trending toward higher clock rates, lower voltage levels, and smaller form factors, the simultaneously switching noise (SSN), which is induced in package and printed circuit board, is one of the major factors affecting the performance and design of the high speed digital circuits. This noise will lead to false switching and malfunctioning in digital and/or analog circuits, and causes serious signal integrity (SI) and electromagnetic interference (EMI) problems for the high speed digital systems. Therefore, mitigating the SSN becomes a major challenge for the high speed circuits design.
In this thesis, first of all, we introduce and discuss previously proposed solutions to suppress the SSN. These solutions include the use of decoupling capacitors, isolation moats, and electromagnetic bnadgap (EBG) structures. We analyzed the EBG structures and generated some EBG design rules. As the speed of digital circuits moving toward higher frequencies, the Double L-bridge EBG structure can be used to improve the performance of Hybrid EBG structure by employing the EBG design rules that were generated. The Double L-bridge EBG structure design improved the behavior at the high frequencies, which also maintained the low frequency performance. It is demonstrated numerically and experimentally. For fast estimating the stopband, we use one-dimensional lump circuit model. Then, we propose another structure, named Double Cross EBG structure. This design, compared to the Double L-bridge EBG structure, not only maintained the high frequency performance, but also improved the low frequency behavior. It is also both experimentally and numerically validated.
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-1026110-144744 |
| Date | 26 October 2010 |
| Creators | Chin, Ta-Cheng |
| Contributors | Chie-In Lee, Chih-Wen Kuo, Lih-Tyng Hwang |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | Cholon |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-1026110-144744 |
| Rights | not_available, Copyright information available at source archive |
Page generated in 0.0024 seconds