Structured Light Illumination (SLI) is the process where spatially varied patterns are projected onto a 3-D surface and based on the distortion by the surface topology, phase information can be calculated and a 3D model constructed. Phase Measuring Profilometry (PMP) is a particular type of SLI that requires three or more patterns temporarily multiplexed. High speed PMP attempts to scan moving objects whose motion is small so as to have little impact on the 3-D model. Given that practically all machine vision cameras and high speed cameras employ a Field Programmable Gate Array (FPGA) interface directly to the image sensors, the opportunity exists to do the processing on camera. This thesis focuses on the design, implementation, testing, and evaluation of a camera-projector system to implement a PMP dual-frequency scheme for 3-D shape measurement on a single FPGA chip. The processor architecture is implemented and tested using the Xilinx Spartan 3 FPGA chip on an Opal Kelly development board. The hardware is described using VHDL and Verilog Hardware Description Languages (HDLs).
| Identifer | oai:union.ndltd.org:uky.edu/oai:uknowledge.uky.edu:ece_etds-1025 |
| Date | 01 January 2013 |
| Creators | Bondehagen, Brent |
| Publisher | UKnowledge |
| Source Sets | University of Kentucky |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | Theses and Dissertations--Electrical and Computer Engineering |
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