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Low temperature modeling of I-V characteristics and RF small signal parameters of SiGe HBTs

Thesis--Auburn University, 2009. / Abstract. Vita. Includes bibliographic references (p.64-66).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/547432175
Date January 2009
CreatorsXu, Ziyan, Niu, Guofu.
PublisherAuburn, Ala. ,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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