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Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18 O-tracer investigations on interface diffusion in Y 2 O 3 /YSZ multilayer systems

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Identiferoai:union.ndltd.org:DRESDEN/oai:qucosa:de:qucosa:12839
Date January 2010
CreatorsSteinmüller, Sven Ole, Aydin, Halit, Rein, Alexander, Korte, Carsten
ContributorsJustus-Liebig-Universität Gießen, Universität Leipzig
Source SetsHochschulschriftenserver (HSSS) der SLUB Dresden
LanguageEnglish
Detected LanguageEnglish
Typedoc-type:article, info:eu-repo/semantics/article, doc-type:Text
SourceDiffusion fundamentals 12 (2010) 55
Rightsinfo:eu-repo/semantics/openAccess
Relationurn:nbn:de:bsz:15-qucosa-178968, qucosa:13502

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