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The application of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to forensic glass analysis and questioned document examination

The combination of analytical sensitivity and selectivity provided by time-of-flight secondary ion mass spectrometry (ToF-SIMS), with advanced statistical interrogation by principal component analysis (PCA), has allowed a significant advancement in the forensic discrimination of pen, pencil and glass materials based on trace characterisation.

Identiferoai:union.ndltd.org:ADTP/269012
Date January 2007
CreatorsDenman, John A
Source SetsAustraliasian Digital Theses Program
LanguageEN-AUS
Detected LanguageEnglish
RightsCopyright John Denman 2007

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