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Electron beam techniques for testing and restructuring of wafer-scale integrated circuits

Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 1981 / Includes bibliographical references. / by David Carl Shaver. / Ph. D. / Ph. D. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science

Identiferoai:union.ndltd.org:MIT/oai:dspace.mit.edu:1721.1/154969
Date January 1981
CreatorsShaver, David Carl.
ContributorsMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science., Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
PublisherMassachusetts Institute of Technology
Source SetsM.I.T. Theses and Dissertation
Detected LanguageEnglish
TypeThesis
Format233 leaves, application/pdf
RightsMIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided., http://dspace.mit.edu/handle/1721.1/7582

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