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Electron beam techniques for testing and restructuring of wafer-scale integrated circuitsShaver, David Carl. January 1981 (has links)
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 1981 / Includes bibliographical references. / by David Carl Shaver. / Ph. D. / Ph. D. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science
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Sticks : a new approach to LSI design.Williams, John Douglas, 1944- January 1977 (has links)
Thesis: M.S., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 1977 / Bibliography : leaves 143-144. / M.S. / M.S. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science
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High-accuracy, speed-optimized positioning system for electron beam lithographyDadok, Luděk. January 1982 (has links)
Thesis: M.S., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 1982 / Vita. / Includes bibliographical references. / by Luděk Dadok. / M.S. / M.S. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science
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